skip to content
Fakebusters II : scientific detection of fakery in art and philately Preview this item
ClosePreview this item
Checking...

Fakebusters II : scientific detection of fakery in art and philately

Author: Richard J Weiss; Duane R Chartier; Society of Photo-optical Instrumentation Engineers.; International Center for Art Intelligence.; Philatelic Fakes Forgeries and Experts.
Publisher: Singapore ; Hackensack, N.J. : World Scientific, ©2004.
Series: Series in popular science, v. 4.
Edition/Format:   eBook : EnglishView all editions and formats
Database:WorldCat
Summary:
Now that the sale of a Picasso painting has exceeded US
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Electronic books
Conference proceedings
Congresses
Additional Physical Format: Print version:
Fakebusters II.
Singapore ; Hackensack, N.J. : World Scientific, c2004
(OCoLC)57515896
Material Type: Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Richard J Weiss; Duane R Chartier; Society of Photo-optical Instrumentation Engineers.; International Center for Art Intelligence.; Philatelic Fakes Forgeries and Experts.
ISBN: 9812701370 9789812701374 9789812560254 9812560254
OCLC Number: 191945165
Notes: "Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."
Description: 1 online resource (x, 317 p.) : ill. (some col.)
Contents: Table of Contents; 1. Preface; 2. R. W. WOOD: FAKEBUSTER EXTRAORDINAIRE; 3. Art Fakes and the Statue of Limitations; 4. Determination of Authenticity of Engraved Scrimshaw; 5. SCIENTIFIC DETECTION OF PHILATELIC FORGERIES; 6. Insurability of Art; 7. DNA as a Security Marker; 8. Authentication at a Small Museum: the Kindness of Strangers; 9. ART IN TRANSIT: INTERNATIONAL TRANSPORTATION OF FINE ART; 10. The Use of Raman Spectroscopy in the Art World; 11. Fakes, Forgeries, and Experts (FFE); 12. Madame Curie; 13. Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX
Series Title: Series in popular science, v. 4.
Other Titles: Scientific detection of fakery in art and philately
Responsibility: edited by Richard J. Weiss and Duane Chartier.
More information:

Abstract:

Now that the sale of a Picasso painting has exceeded US

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/191945165> # Fakebusters II scientific detection of fakery in art and philately
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "191945165" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nju> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/794147705#Place/singapore> ; # Singapore
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/794147705#Place/hackensack_n_j> ; # Hackensack, N.J.
    schema:about <http://id.loc.gov/authorities/classification/N8790> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/travel_museums_tours_points_of_interest> ; # TRAVEL--Museums, Tours, Points of Interest
    schema:about <http://id.loc.gov/authorities/subjects/sh85046452> ; # Expertising, X-ray
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/detectie> ; # Detectie
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/art_radiography> ; # Art--Radiography
    schema:about <http://id.loc.gov/authorities/subjects/sh85007484> ; # Art--Forgeries
    schema:about <http://id.loc.gov/authorities/subjects/sh85007481> ; # Art--Expertising
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/business_&_economics_museum_administration_&_museology> ; # BUSINESS & ECONOMICS--Museum Administration & Museology
    schema:about <http://id.worldcat.org/fast/918537> ; # Expertising, X-ray
    schema:about <http://id.loc.gov/authorities/subjects/sh86000724> ; # Art--Radiography
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/art_expertising> ; # Art--Expertising
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/reference_general> ; # REFERENCE--General
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/vervalsing> ; # Vervalsing
    schema:about <http://id.loc.gov/authorities/subjects/sh85118625> ; # Science and the arts
    schema:about <http://id.worldcat.org/fast/815430> ; # Art and science
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/art_and_science> ; # Art and science
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/electronic_books> ; # Electronic books
    schema:about <http://id.worldcat.org/fast/815244> ; # Art--Expertising
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/art_forgeries> ; # Art--Forgeries
    schema:about <http://id.worldcat.org/fast/815323> ; # Art--Radiography
    schema:about <http://dewey.info/class/069.54/e22/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/794147705#Topic/wetenschappelijke_technieken> ; # Wetenschappelijke technieken
    schema:about <http://id.worldcat.org/fast/1108556> ; # Science and the arts
    schema:about <http://id.worldcat.org/fast/815252> ; # Art--Forgeries
    schema:alternateName "Scientific detection of fakery in art and philately" ;
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/125848785> ; # International Center for Art Intelligence.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/794147705#Organization/society_of_photo_optical_instrumentation_engineers> ; # Society of Photo-optical Instrumentation Engineers.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/794147705#Organization/philatelic_fakes_forgeries_and_experts> ; # Philatelic Fakes Forgeries and Experts.
    schema:contributor <http://viaf.org/viaf/111608336> ; # Richard Jerome Weiss
    schema:contributor <http://viaf.org/viaf/16553307> ; # Duane R. Chartier
    schema:copyrightYear "2004" ;
    schema:datePublished "2004" ;
    schema:description "Table of Contents; 1. Preface; 2. R. W. WOOD: FAKEBUSTER EXTRAORDINAIRE; 3. Art Fakes and the Statue of Limitations; 4. Determination of Authenticity of Engraved Scrimshaw; 5. SCIENTIFIC DETECTION OF PHILATELIC FORGERIES; 6. Insurability of Art; 7. DNA as a Security Marker; 8. Authentication at a Small Museum: the Kindness of Strangers; 9. ART IN TRANSIT: INTERNATIONAL TRANSPORTATION OF FINE ART; 10. The Use of Raman Spectroscopy in the Art World; 11. Fakes, Forgeries, and Experts (FFE); 12. Madame Curie; 13. Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX"@en ;
    schema:description "Now that the sale of a Picasso painting has exceeded US"@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/794147705> ;
    schema:genre "Conference proceedings"@en ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/794147705#Series/series_in_popular_science> ; # Series in popular science ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/57515896> ;
    schema:name "Fakebusters II scientific detection of fakery in art and philately"@en ;
    schema:numberOfPages "317" ;
    schema:productID "191945165" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/191945165#PublicationEvent/singapore_hackensack_n_j_world_scientific_c2004> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/794147705#Agent/world_scientific> ; # World Scientific
    schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=167306> ;
    schema:url <http://www.myilibrary.com?id=189709> ;
    schema:url <http://catdir.loc.gov/catdir/toc/fy0712/2007274489.html> ;
    schema:url <http://site.ebrary.com/id/10174034> ;
    schema:workExample <http://worldcat.org/isbn/9789812560254> ;
    schema:workExample <http://worldcat.org/isbn/9789812701374> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/191945165> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/794147705#Agent/world_scientific> # World Scientific
    a bgn:Agent ;
    schema:name "World Scientific" ;
    .

<http://experiment.worldcat.org/entity/work/data/794147705#Organization/philatelic_fakes_forgeries_and_experts> # Philatelic Fakes Forgeries and Experts.
    a schema:Organization ;
    schema:name "Philatelic Fakes Forgeries and Experts." ;
    .

<http://experiment.worldcat.org/entity/work/data/794147705#Organization/society_of_photo_optical_instrumentation_engineers> # Society of Photo-optical Instrumentation Engineers.
    a schema:Organization ;
    schema:name "Society of Photo-optical Instrumentation Engineers." ;
    .

<http://experiment.worldcat.org/entity/work/data/794147705#Place/hackensack_n_j> # Hackensack, N.J.
    a schema:Place ;
    schema:name "Hackensack, N.J." ;
    .

<http://experiment.worldcat.org/entity/work/data/794147705#Series/series_in_popular_science> # Series in popular science ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/191945165> ; # Fakebusters II scientific detection of fakery in art and philately
    schema:name "Series in popular science ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/794147705#Topic/art_expertising> # Art--Expertising
    a schema:Intangible ;
    schema:name "Art--Expertising"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/794147705#Topic/art_radiography> # Art--Radiography
    a schema:Intangible ;
    schema:name "Art--Radiography"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/794147705#Topic/business_&_economics_museum_administration_&_museology> # BUSINESS & ECONOMICS--Museum Administration & Museology
    a schema:Intangible ;
    schema:name "BUSINESS & ECONOMICS--Museum Administration & Museology"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/794147705#Topic/reference_general> # REFERENCE--General
    a schema:Intangible ;
    schema:name "REFERENCE--General"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/794147705#Topic/travel_museums_tours_points_of_interest> # TRAVEL--Museums, Tours, Points of Interest
    a schema:Intangible ;
    schema:name "TRAVEL--Museums, Tours, Points of Interest"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/794147705#Topic/wetenschappelijke_technieken> # Wetenschappelijke technieken
    a schema:Intangible ;
    schema:name "Wetenschappelijke technieken"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85007481> # Art--Expertising
    a schema:Intangible ;
    schema:name "Art--Expertising"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85007484> # Art--Forgeries
    a schema:Intangible ;
    schema:name "Art--Forgeries"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85046452> # Expertising, X-ray
    a schema:Intangible ;
    schema:name "Expertising, X-ray"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85118625> # Science and the arts
    a schema:Intangible ;
    schema:name "Science and the arts"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh86000724> # Art--Radiography
    a schema:Intangible ;
    schema:name "Art--Radiography"@en ;
    .

<http://id.worldcat.org/fast/1108556> # Science and the arts
    a schema:Intangible ;
    schema:name "Science and the arts"@en ;
    .

<http://id.worldcat.org/fast/815244> # Art--Expertising
    a schema:Intangible ;
    schema:name "Art--Expertising"@en ;
    .

<http://id.worldcat.org/fast/815252> # Art--Forgeries
    a schema:Intangible ;
    schema:name "Art--Forgeries"@en ;
    .

<http://id.worldcat.org/fast/815323> # Art--Radiography
    a schema:Intangible ;
    schema:name "Art--Radiography"@en ;
    .

<http://id.worldcat.org/fast/815430> # Art and science
    a schema:Intangible ;
    schema:name "Art and science"@en ;
    .

<http://id.worldcat.org/fast/918537> # Expertising, X-ray
    a schema:Intangible ;
    schema:name "Expertising, X-ray"@en ;
    .

<http://viaf.org/viaf/111608336> # Richard Jerome Weiss
    a schema:Person ;
    schema:birthDate "1923" ;
    schema:familyName "Weiss" ;
    schema:givenName "Richard Jerome" ;
    schema:givenName "Richard J." ;
    schema:name "Richard Jerome Weiss" ;
    .

<http://viaf.org/viaf/125848785> # International Center for Art Intelligence.
    a schema:Organization ;
    schema:name "International Center for Art Intelligence." ;
    .

<http://viaf.org/viaf/16553307> # Duane R. Chartier
    a schema:Person ;
    schema:familyName "Chartier" ;
    schema:givenName "Duane R." ;
    schema:name "Duane R. Chartier" ;
    .

<http://worldcat.org/isbn/9789812560254>
    a schema:ProductModel ;
    schema:bookFormat schema:Paperback ;
    schema:isbn "9812560254" ;
    schema:isbn "9789812560254" ;
    .

<http://worldcat.org/isbn/9789812701374>
    a schema:ProductModel ;
    schema:description "electronic bk." ;
    schema:isbn "9812701370" ;
    schema:isbn "9789812701374" ;
    .

<http://www.worldcat.org/oclc/57515896>
    a schema:CreativeWork ;
    rdfs:label "Fakebusters II." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/191945165> ; # Fakebusters II scientific detection of fakery in art and philately
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.