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Fakebusters II : scientific detection of fakery in art and philately

Author: Richard J Weiss; Duane R Chartier; Society of Photo-optical Instrumentation Engineers.; International Center for Art Intelligence.; Philatelic Fakes Forgeries and Experts.
Publisher: Singapore ; Hackensack, N.J. : World Scientific, ©2004.
Series: Series in popular science, v. 4.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:
Now that the sale of a Picasso painting has exceeded US
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Genre/Form: Electronic books
Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Fakebusters II.
Singapore ; Hackensack, N.J. : World Scientific, ©2004
(OCoLC)57515896
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Richard J Weiss; Duane R Chartier; Society of Photo-optical Instrumentation Engineers.; International Center for Art Intelligence.; Philatelic Fakes Forgeries and Experts.
ISBN: 9812701370 9789812701374 9789812560254 9812560254
OCLC Number: 191945165
Notes: "Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."
Description: 1 online resource (x, 317 pages) : illustrations (some color).
Contents: Table of Contents; 1. Preface; 2. R.W. WOOD: FAKEBUSTER EXTRAORDINAIRE; 3. Art Fakes and the Statue of Limitations; 4. Determination of Authenticity of Engraved Scrimshaw; 5. SCIENTIFIC DETECTION OF PHILATELIC FORGERIES; 6. Insurability of Art; 7. DNA as a Security Marker; 8. Authentication at a Small Museum: the Kindness of Strangers; 9. ART IN TRANSIT: INTERNATIONAL TRANSPORTATION OF FINE ART; 10. The Use of Raman Spectroscopy in the Art World; 11. Fakes, Forgeries, and Experts (FFE); 12. Madame Curie; 13. Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX.
Series Title: Series in popular science, v. 4.
Other Titles: Scientific detection of fakery in art and philately
Responsibility: edited by Richard J. Weiss and Duane Chartier.
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Abstract:

The articles represent 24 expert contributions on relevant topics pertaining to the scientific detection of forgery in art and philately.  Read more...

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