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Fast risetime reverse bias pulse failures in SiC PN junction diodes

Author: Philip G Nuedeck; Christian Faziz; James D Parsons; Lewis Research Center,; United States. National Aeronautics and Space Administration,
Publisher: Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, June 1996.
Series: NASA technical memorandum, 107256.
Edition/Format:   eBook : Document : National government publication : EnglishView all editions and formats
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Additional Physical Format: Microfiche version:
Nuedeck, Philip G.
Fast risetime reverse bias pulse failures in SiC PN junction diodes
(OCoLC)39668882
Material Type: Document, Government publication, National government publication, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Philip G Nuedeck; Christian Faziz; James D Parsons; Lewis Research Center,; United States. National Aeronautics and Space Administration,
OCLC Number: 953458792
Notes: Title from title screen (viewed July 12, 2016).
"June 1996"--Report documentation page.
"Prepared for the Third International High Temperature Electronics Conference sponsored by the Sandia National Laboratories, Albuquerque, New Mexico, June 9-14, 1996."
"Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page.
Description: 1 online resource (6 pages) : illustrations.
Series Title: NASA technical memorandum, 107256.
Responsibility: Philip G. Nuedeck, Christian Faziz, James D. Parsons.

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