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Fault covering problems in reconfigurable VLSI systems

Author: Ran Libeskind-Hadas
Publisher: Boston : Kluwer, ©1992.
Series: Kluwer international series in engineering and computer science, SECS 172.; Kluwer international series in engineering and computer science., VLSI, computer architecture, and digital signal processing.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Summary:

Describes the authors' research on reconfiguration problems for fault-tolerance in VLSI and WSI Systems. This book examines solutions to a number of reconfiguration problems. It also provides  Read more...

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Additional Physical Format: Online version:
Fault covering problems in reconfigurable VLSI systems.
Boston : Kluwer, ©1992
(OCoLC)645813440
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Ran Libeskind-Hadas
ISBN: 0792392310 9780792392316
OCLC Number: 25316145
Description: xiii, 130 pages : illustrations ; 25 cm.
Contents: 1 An Overview.- 1.1 Introduction.- 1.2 The Embedding Approach.- 1.3 The Covering Approach.- 1.3.1 Previous Work.- 1.3.2 Physical Implementation Issues in Reconfigurable Design.- 1.4 Overview of Remaining Chapters.- 2 Fault Covers in Rectangular Arrays.- 2.1 Introduction.- 2.2 Admissible Assignments.- 2.3 The Feasible Minimum Cover Problem.- 2.3.1 Critical Sets.- 2.3.2 An Exhaustive Search Algorithm for the Feasible Minimum Cover Problem.- 2.3.3 Experimental Results.- 2.4 The Feasible Cover Problem.- 2.4.1 Excess-k Critical Sets.- 2.4.2 Experimental Results.- 2.5 Two Reconfiguration Problems.- 2.5.1 Reconfiguration with Shared Spares.- 2.5.2 Reconfiguration of Programmable Logic Arrays.- 2.6 Summary.- 3 Fault Covers in Heterogeneous and General Arrays.- 3.1 Introduction.- 3.2 Fault Covers in Heterogeneous Arrays.- 3.2.1 The Feasible Cover Problem.- 3.2.2 The Feasible Minimum Cover Problem.- 3.2.3 The Minimum Feasible Cover Problem.- 3.2.4 The Feasible Cover Problem with multiple Spare Arrays.- 3.2.5 Applications of the Heterogeneous Array Model.- 3.3 Fault Covers in General Arrays.- 3.3.1 The Feasible Cover Problem.- 3.3.2 The Feasible Minimum Cover Problem.- 3.3.3 The Minimum Feasible Cover Problem.- 3.4 Summary.- 4 General Formulation of Fault Covering Problems.- 4.1 Introduction.- 4.2 A General Formulation.- 4.3 Illustrative Examples.- 4.4 Integer Linear Programming Approach.- 4.4.1 The General Transformation.- 4.4.2 Experimental Results.- 4.5 Complexity Analysis of Subcases.- 4.5.1 The Definition of Subcases and Their Complexities.- 4.5.2 Polynomial Time Algorithms.- 4.5.3 NP-Completeness Results.- 4.6 Summary.
Series Title: Kluwer international series in engineering and computer science, SECS 172.; Kluwer international series in engineering and computer science., VLSI, computer architecture, and digital signal processing.
Responsibility: by Ran Libeskind-Hadas [and others].
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Primary Entity

<http://www.worldcat.org/oclc/25316145> # Fault covering problems in reconfigurable VLSI systems
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "25316145" ;
   library:placeOfPublication <http://dbpedia.org/resource/Boston> ; # Boston
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/mau> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/28013541#Topic/vlsi> ; # VLSI
   schema:about <http://id.worldcat.org/fast/975563> ; # Integrated circuits--Fault tolerance
   schema:about <http://experiment.worldcat.org/entity/work/data/28013541#Thing/integrated_circuits> ; # Integrated circuits
   schema:about <http://id.loc.gov/authorities/subjects/sh96008890> ; # Integrated circuits--Fault tolerance
   schema:about <http://experiment.worldcat.org/entity/work/data/28013541#Topic/fehlertoleranz> ; # Fehlertoleranz
   schema:about <http://experiment.worldcat.org/entity/work/data/28013541#Topic/integrated_circuits_wafer_scale_integration_design_and_construction_data_processing> ; # Integrated circuits--Wafer-scale integration--Design and construction--Data processing
   schema:about <http://id.loc.gov/authorities/subjects/sh2009127318> ; # Integrated circuits--Very large scale integration--Design and construction--Data processing
   schema:about <http://dewey.info/class/621.395/e20/> ;
   schema:about <http://id.worldcat.org/fast/975622> ; # Integrated circuits--Wafer-scale integration--Design and construction--Data processing
   schema:about <http://experiment.worldcat.org/entity/work/data/28013541#Topic/uberdeckung_mathematik> ; # Überdeckung (Mathematik)
   schema:about <http://id.worldcat.org/fast/975611> ; # Integrated circuits--Very large scale integration--Design and construction--Data processing
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://experiment.worldcat.org/entity/work/data/28013541#Person/libeskind_hadas_ran> ; # Ran Libeskind-Hadas
   schema:copyrightYear "1992" ;
   schema:datePublished "1992" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/28013541> ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/28013541#Series/kluwer_international_series_in_engineering_and_computer_science> ; # Kluwer international series in engineering and computer science.
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/28013541#Series/the_kluwer_international_series_in_engineering_and_computer_science_vlsi_computer_architecture_and_digital_signal_processing> ; # The Kluwer international series in engineering and computer science ; VLSI, computer architecture, and digital signal processing
   schema:isSimilarTo <http://www.worldcat.org/oclc/645813440> ;
   schema:name "Fault covering problems in reconfigurable VLSI systems"@en ;
   schema:productID "25316145" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/25316145#PublicationEvent/boston_kluwer_1992> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/28013541#Agent/kluwer> ; # Kluwer
   schema:url <http://www.gbv.de/dms/bowker/toc/9780792392316.pdf> ;
   schema:url <http://catdir.loc.gov/catdir/enhancements/fy0821/92004369-t.html> ;
   schema:workExample <http://worldcat.org/isbn/9780792392316> ;
   umbel:isLike <http://bnb.data.bl.uk/id/resource/GB9232385> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/25316145> ;
    .


Related Entities

<http://dbpedia.org/resource/Boston> # Boston
    a schema:Place ;
   schema:name "Boston" ;
    .

<http://experiment.worldcat.org/entity/work/data/28013541#Person/libeskind_hadas_ran> # Ran Libeskind-Hadas
    a schema:Person ;
   schema:familyName "Libeskind-Hadas" ;
   schema:givenName "Ran" ;
   schema:name "Ran Libeskind-Hadas" ;
    .

<http://experiment.worldcat.org/entity/work/data/28013541#Series/kluwer_international_series_in_engineering_and_computer_science> # Kluwer international series in engineering and computer science.
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/25316145> ; # Fault covering problems in reconfigurable VLSI systems
   schema:name "Kluwer international series in engineering and computer science." ;
   schema:name "Kluwer international series in engineering and computer science ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/28013541#Series/the_kluwer_international_series_in_engineering_and_computer_science_vlsi_computer_architecture_and_digital_signal_processing> # The Kluwer international series in engineering and computer science ; VLSI, computer architecture, and digital signal processing
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/25316145> ; # Fault covering problems in reconfigurable VLSI systems
   schema:name "The Kluwer international series in engineering and computer science ; VLSI, computer architecture, and digital signal processing" ;
    .

<http://experiment.worldcat.org/entity/work/data/28013541#Thing/integrated_circuits> # Integrated circuits
    a schema:Thing ;
   schema:name "Integrated circuits" ;
    .

<http://experiment.worldcat.org/entity/work/data/28013541#Topic/integrated_circuits_wafer_scale_integration_design_and_construction_data_processing> # Integrated circuits--Wafer-scale integration--Design and construction--Data processing
    a schema:Intangible ;
   schema:hasPart <http://id.loc.gov/authorities/subjects/sh88004308> ;
   schema:name "Integrated circuits--Wafer-scale integration--Design and construction--Data processing"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/28013541#Topic/uberdeckung_mathematik> # Überdeckung (Mathematik)
    a schema:Intangible ;
   schema:name "Überdeckung (Mathematik)"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2009127318> # Integrated circuits--Very large scale integration--Design and construction--Data processing
    a schema:Intangible ;
   schema:name "Integrated circuits--Very large scale integration--Design and construction--Data processing"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh96008890> # Integrated circuits--Fault tolerance
    a schema:Intangible ;
   schema:name "Integrated circuits--Fault tolerance"@en ;
    .

<http://id.worldcat.org/fast/975563> # Integrated circuits--Fault tolerance
    a schema:Intangible ;
   schema:name "Integrated circuits--Fault tolerance"@en ;
    .

<http://id.worldcat.org/fast/975611> # Integrated circuits--Very large scale integration--Design and construction--Data processing
    a schema:Intangible ;
   schema:name "Integrated circuits--Very large scale integration--Design and construction--Data processing"@en ;
    .

<http://id.worldcat.org/fast/975622> # Integrated circuits--Wafer-scale integration--Design and construction--Data processing
    a schema:Intangible ;
   schema:name "Integrated circuits--Wafer-scale integration--Design and construction--Data processing"@en ;
    .

<http://worldcat.org/isbn/9780792392316>
    a schema:ProductModel ;
   schema:isbn "0792392310" ;
   schema:isbn "9780792392316" ;
    .

<http://www.worldcat.org/oclc/645813440>
    a schema:CreativeWork ;
   rdfs:label "Fault covering problems in reconfigurable VLSI systems." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/25316145> ; # Fault covering problems in reconfigurable VLSI systems
    .


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