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Fault injection techniques and tools for embedded systems reliability evaluation

Author: Alfredo Benso; Paolo Prinetto
Publisher: Boston : Kluwer Academic Publishers, ©2003.
Series: Frontiers in electronic testing, 23.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

This is a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different fault injection techniques  Read more...

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Details

Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Alfredo Benso; Paolo Prinetto
ISBN: 1402075898 9781402075896
OCLC Number: 52784706
Description: xiv, 241 pages : illustrations ; 25 cm.
Contents: A First Look at Fault Injection --
Fault Injection Techniques --
The Metrics of Dependability --
Dependability Factors --
Fault Category --
Fault Space --
Hardware/Physical Fault --
Software Fault --
Statistical Fault Coverage Estimation --
Forced Coverage --
Fault Coverage Estimation with One-Sided Confidence Interval --
Mean Time To Unsafe Failure (MTTUF) [SMIT_00] --
An Overview of Fault Injection --
The History of Fault Injection --
Sampling Process --
Fault Injection Environment [HSUE_97] --
Quantitative Safety Assessment Model --
The FARM Model --
Levels of Abstraction of Fault Injection --
The Fault Injection Attributes --
Hardware-based Fault Injection --
Assumptions --
Advantages --
Disadvantages --
Tools --
Software-based Fault Injection --
Assumptions --
Advantages --
Disadvantages --
Tools --
Simulation-based Fault Injection --
Assumptions --
Advantages --
Disadvantages --
Tools --
Hybrid Fault Injection --
Tools --
Objectives of Fault Injection --
Fault Removal [AVRE_92] --
Fault Forecasting [ARLA_90] --
Further Researches --
No-Response Faults --
Large Number of Fault Injection Experiments Required --
Dependability Evaluation Methods --
Types of Dependability Evaluation Methods --
Dependability Evaluation by Analysis --
Dependability Evaluation by Field Experience --
Dependability Evaluation by Fault Injection Testing --
Soft Errors on Digital Components --
Soft Errors --
Radiation Effects (SEU, SEE) --
SER measurement and testing --
SEU and technology scaling --
Trends in DRAMs, SRAMs and FLASHs.
Series Title: Frontiers in electronic testing, 23.
Responsibility: edited by Alfredo Benso and Paolo Prinetto.
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