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Fault-tolerance techniques for SRAM-based FPGAs

Author: Fernanda Lima Kastensmidt; Luigi Carro; Ricardo A L Reis
Publisher: Dordrecht : Springer, 2006.
Series: Frontiers in electronic testing, 32.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:
Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technology process of semiconductor components, in terms of transistor geometry shrinking, power supply, speed, and logic  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Kastensmidt, Fernanda Lima.
Fault-tolerance techniques for SRAM-based FPGAs.
Dordrecht : Springer, 2006
(DLC) 2007270463
(OCoLC)69105498
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Fernanda Lima Kastensmidt; Luigi Carro; Ricardo A L Reis
ISBN: 9780387310695 038731069X 0387310681 9780387310688
OCLC Number: 209920029
Description: 1 online resource (xv, 183 pages) : illustrations.
Contents: Radiation Effects in Integrated Circuits --
Single Event Upset (SEU) Mitigation Techniques --
Architectural SEU Mitigation Techniques --
High-Level SEU Mitigation Techniques --
Triple Modular Redundancy (TMR) Robustness --
Designing and Testing a TMR Micro-Controller --
Reducing TMR Overheads: Part I --
Reducing TMR Overheads: Part II --
Final Remarks.
Series Title: Frontiers in electronic testing, 32.
Responsibility: by Fernanda Lima Kastensmidt, Luigi Carro and Ricardo Reis.
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Abstract:

Reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. This title helps the reader choose the best  Read more...

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