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|All Authors / Contributors:||
Marc Lavarde; Pascal Massart; Patrick Pamphile; Université de Paris-Sud. Faculté des Sciences d'Orsay (Essonne).
|Description:||1 vol. (VI-133 p.) : ill. ; 30 cm.|
|Responsibility:||Marc Lavarde ; sous la direction de [Pascal Massart et Patrick Pamphile].|
This thesis deals with the using of accelerating data and regression model selection for high technology field: semiconductor chips. The accelerating trail gives us regression frameworks. The aim of the accelerating test consists on fitting the logarithm of the lifetime through the use of some function f, called the acceleration function. However, accelerating data may have misleading and complex comportment. In order to adapt the model with such data, we have proposed to detect the changes on the comportment of the acceleration function. We have considered a collection of piecewise acceleration models candidate to the estimation. For each model candidate we have estimated the least-squares estimation. And we have selected the final estimator using a penalized criterion. The penalized estimator is optimal approximation of the reality since the quadratic risk of penalized estimator is bounded by the minimal risk upon every least-squares estimators candidates. Moreover, this oracle inequality is non asymptotic. Furthermore, we have considered classical reliability cases: the Lognormal case associating with some fatigue failure, and the Weibull case associating with some choc failure. Lastly we have implemented model selection tools in order to realise survey study without a priori on the acceleration models and to use overstress trials.