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Field-ion microscopy.

Author: K M Bowkett; David A Smith
Publisher: Amsterdam, North-Holland Pub. Co., 1970.
Series: Defects in crystalline solids, v. 2.
Edition/Format:   Print book : EnglishView all editions and formats
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Document Type: Book
All Authors / Contributors: K M Bowkett; David A Smith
ISBN: 072041752X 9780720417524 0444100040 9780444100047
OCLC Number: 126564
Description: x, 257 pages with illustrations 23 cm.
Series Title: Defects in crystalline solids, v. 2.
Responsibility: [By] K. Bowkett and D.A. Smith.

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