skip to content
Fifth International Symposium on Instrumentation Science and Technology : 15-18 September 2008, Shenyang, China Preview this item
ClosePreview this item
Checking...

Fifth International Symposium on Instrumentation Science and Technology : 15-18 September 2008, Shenyang, China

Author: J Tan; Xianfang Wen; SPIE (Society)
Publisher: Bellingham, Wash. : SPIE, 2009.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 7133.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Database:WorldCat
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
International Symposium on Instrumentation Science and Technology (5th : 2008 : Shenyang, China).
Fifth International Symposium on Instrumentation Science and Technology.
Bellingham, Wash. : SPIE, ©2009
(OCoLC)310114662
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: J Tan; Xianfang Wen; SPIE (Society)
ISBN: 9780819473677 0819473677
OCLC Number: 310452907
Notes: Title from title screen (viewed February 24, 2009).
Issued as part of the SPIE Digital Library.
Description: 1 electronic text (PDF) : illustrations (some color).
Details: Mode of access: World Wide Web.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 7133.
Other Titles: International Symposium on Instrumentation Science and Technology
SPIE digital library.
Responsibility: Jiubin Tan, Xianfang Wen, editors ; sponsored by ICMI--International Committee on Measurements and Instrumentation [and others] ; organized by ICMI--International Committee on Measurements and Instrumentation [and others] ; co-organized by Shenyang University of Technology (China) ; cooperating organization [and] published by SPIE.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/310452907> # Fifth International Symposium on Instrumentation Science and Technology : 15-18 September 2008, Shenyang, China
    a schema:Book, schema:CreativeWork, schema:MediaObject ;
    library:oclcnum "310452907" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/wau> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/349995045#Place/bellingham_wash> ; # Bellingham, Wash.
    rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/349995045#CreativeWork/spie_digital_library> ; # SPIE digital library.
    schema:about <http://id.worldcat.org/fast/907299> ; # Electronic instruments
    schema:about <http://experiment.worldcat.org/entity/work/data/349995045#Topic/electronic_instruments> ; # Electronic instruments
    schema:about <http://id.worldcat.org/fast/1715944> ; # Measurement
    schema:about <http://id.worldcat.org/fast/907353> ; # Electronic measurements
    schema:about <http://experiment.worldcat.org/entity/work/data/349995045#Topic/electronic_measurements> ; # Electronic measurements
    schema:about <http://experiment.worldcat.org/entity/work/data/349995045#Topic/measurement> ; # Measurement
    schema:alternateName "International Symposium on Instrumentation Science and Technology" ;
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/144628493> ; # SPIE (Society)
    schema:contributor <http://viaf.org/viaf/28447095> ; # Xianfang Wen
    schema:contributor <http://experiment.worldcat.org/entity/work/data/349995045#Person/tan_j_jiubin> ; # Jiubin Tan
    schema:creator <http://experiment.worldcat.org/entity/work/data/349995045#Meeting/international_symposium_on_instrumentation_science_and_technology_5th_2008_shenyang_shi_china> ; # International Symposium on Instrumentation Science and Technology (5th : 2008 : Shenyang Shi, China)
    schema:datePublished "2009" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/349995045> ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Conference publication"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://worldcat.org/issn/0277-786X> ; # Proceedings of SPIE,
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/349995045#Series/proceedings_of_spie_the_international_society_for_optical_engineering> ; # Proceedings of SPIE--the International Society for Optical Engineering ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/310114662> ;
    schema:name "Fifth International Symposium on Instrumentation Science and Technology : 15-18 September 2008, Shenyang, China"@en ;
    schema:productID "310452907" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/310452907#PublicationEvent/bellingham_wash_spie_2009> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/349995045#Agent/spie> ; # SPIE
    schema:url <http://link.spie.org/PSISDG/7133/1> ;
    schema:workExample <http://worldcat.org/isbn/9780819473677> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/310452907> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/349995045#CreativeWork/spie_digital_library> # SPIE digital library.
    a schema:CreativeWork ;
    schema:name "SPIE digital library." ;
    .

<http://experiment.worldcat.org/entity/work/data/349995045#Meeting/international_symposium_on_instrumentation_science_and_technology_5th_2008_shenyang_shi_china> # International Symposium on Instrumentation Science and Technology (5th : 2008 : Shenyang Shi, China)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/349995045#Place/shenyang_shi_china> ; # Shenyang Shi, China)
    schema:name "International Symposium on Instrumentation Science and Technology (5th : 2008 : Shenyang Shi, China)" ;
    .

<http://experiment.worldcat.org/entity/work/data/349995045#Person/tan_j_jiubin> # Jiubin Tan
    a schema:Person ;
    schema:familyName "Tan" ;
    schema:givenName "Jiubin" ;
    schema:givenName "J." ;
    schema:name "Jiubin Tan" ;
    .

<http://experiment.worldcat.org/entity/work/data/349995045#Place/bellingham_wash> # Bellingham, Wash.
    a schema:Place ;
    schema:name "Bellingham, Wash." ;
    .

<http://experiment.worldcat.org/entity/work/data/349995045#Place/shenyang_shi_china> # Shenyang Shi, China)
    a schema:Place ;
    schema:name "Shenyang Shi, China)" ;
    .

<http://experiment.worldcat.org/entity/work/data/349995045#Series/proceedings_of_spie_the_international_society_for_optical_engineering> # Proceedings of SPIE--the International Society for Optical Engineering ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/310452907> ; # Fifth International Symposium on Instrumentation Science and Technology : 15-18 September 2008, Shenyang, China
    schema:name "Proceedings of SPIE--the International Society for Optical Engineering ;" ;
    .

<http://id.worldcat.org/fast/1715944> # Measurement
    a schema:Intangible ;
    schema:name "Measurement"@en ;
    .

<http://id.worldcat.org/fast/907299> # Electronic instruments
    a schema:Intangible ;
    schema:name "Electronic instruments"@en ;
    .

<http://id.worldcat.org/fast/907353> # Electronic measurements
    a schema:Intangible ;
    schema:name "Electronic measurements"@en ;
    .

<http://viaf.org/viaf/144628493> # SPIE (Society)
    a schema:Organization ;
    schema:name "SPIE (Society)" ;
    .

<http://viaf.org/viaf/28447095> # Xianfang Wen
    a schema:Person ;
    schema:familyName "Wen" ;
    schema:givenName "Xianfang" ;
    schema:name "Xianfang Wen" ;
    .

<http://worldcat.org/isbn/9780819473677>
    a schema:ProductModel ;
    schema:isbn "0819473677" ;
    schema:isbn "9780819473677" ;
    .

<http://worldcat.org/issn/0277-786X> # Proceedings of SPIE,
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/310452907> ; # Fifth International Symposium on Instrumentation Science and Technology : 15-18 September 2008, Shenyang, China
    schema:issn "0277-786X" ;
    schema:name "Proceedings of SPIE," ;
    .

<http://www.worldcat.org/oclc/310114662>
    a schema:CreativeWork ;
    rdfs:label "Fifth International Symposium on Instrumentation Science and Technology." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/310452907> ; # Fifth International Symposium on Instrumentation Science and Technology : 15-18 September 2008, Shenyang, China
    .

<http://www.worldcat.org/title/-/oclc/310452907>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/310452907> ; # Fifth International Symposium on Instrumentation Science and Technology : 15-18 September 2008, Shenyang, China
    schema:dateModified "2016-08-24" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.