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| Additional Physical Format: | Online version: Larrabee, R. D. FORTRAN program for calculating the electrical parameters of extrinsic silicon. Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1980 (OCoLC)607058584 |
|---|---|
| Material Type: | Government publication, National government publication |
| Document Type: | Book |
| All Authors / Contributors: |
R D Larrabee; W Robert Thurber; W Murray Bullis; United States. National Bureau of Standards.; Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division. |
| OCLC Number: | 7040743 |
| Notes: | "Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards." "Issued October 1980." S/N 003-003-02260-8. Item 247. |
| Description: | iv, 48 p. ; 27 cm. |
| Series Title: | Semiconductor measurement technology; NBS special publication, 400-63 |
| Responsibility: | R.D. Larrabee, W.R. Thurber, and W.M. Bullis. |
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