skip to content
Fringe pattern analysis : 8-9 August 1989, San Diego, California Preview this item
ClosePreview this item
Checking...

Fringe pattern analysis : 8-9 August 1989, San Diego, California

Author: Graeme T Reid; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash., USA : SPIE, ©1989.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 1163.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Fringe pattern analysis.
Bellingham, Wash., USA : SPIE, ©1989
(DLC) 89043273
(OCoLC)20848257
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Graeme T Reid; Society of Photo-optical Instrumentation Engineers.
OCLC Number: 643839677
Reproduction Notes: Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2010. MiAaHDL
Description: 1 online resource (vi, 260 pages) : illustrations.
Details: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 1163.
Responsibility: Graeme T. Reid, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/643839677> # Fringe pattern analysis : 8-9 August 1989, San Diego, California
    a schema:Book, schema:MediaObject, schema:CreativeWork ;
    library:oclcnum "643839677" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/wau> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/365654606#Place/bellingham_wash_usa> ; # Bellingham, Wash., USA
    schema:about <http://id.worldcat.org/fast/967501> ; # Image processing
    schema:about <http://experiment.worldcat.org/entity/work/data/365654606#Topic/conferences> ; # CONFERENCES
    schema:about <http://experiment.worldcat.org/entity/work/data/365654606#Topic/interferometry> ; # INTERFEROMETRY
    schema:about <http://id.loc.gov/authorities/subjects/sh85037932> ; # Diffraction patterns
    schema:about <http://id.worldcat.org/fast/976235> ; # Interferometry
    schema:about <http://experiment.worldcat.org/entity/work/data/365654606#Topic/speckle_interferometry> ; # SPECKLE INTERFEROMETRY
    schema:about <http://id.worldcat.org/fast/893521> ; # Diffraction patterns
    schema:about <http://experiment.worldcat.org/entity/work/data/365654606#Topic/image_processing> ; # IMAGE PROCESSING
    schema:about <http://experiment.worldcat.org/entity/work/data/365654606#Topic/diffraction_patterns> ; # DIFFRACTION PATTERNS
    schema:about <http://dewey.info/class/621.36/e20/> ;
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/151856603> ; # Society of Photo-optical Instrumentation Engineers.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/365654606#Meeting/spie_conference_on_fringe_pattern_analysis_1st_1989_san_diego_calif> ; # SPIE Conference on Fringe Pattern Analysis (1st : 1989 : San Diego, Calif.)
    schema:contributor <http://viaf.org/viaf/38536794> ; # Graeme T. Reid
    schema:copyrightYear "1989" ;
    schema:datePublished "1989" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/365654606> ;
    schema:genre "Conference publication"@en ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://worldcat.org/issn/0277-786X> ; # Proceedings of SPIE--the International Society for Optical Engineering ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/365654606#Series/proceedings_spie_the_international_society_for_optical_engineering> ; # Proceedings / SPIE--the International Society for Optical Engineering ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/20848257> ;
    schema:name "Fringe pattern analysis : 8-9 August 1989, San Diego, California"@en ;
    schema:productID "643839677" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/643839677#PublicationEvent/bellingham_wash_usa_spie_1989> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/365654606#Agent/spie> ; # SPIE
    schema:url <http://proxy.library.carleton.ca/login?url=http://link.spie.org/PSISDG/1163/1> ;
    schema:url <http://catalog.hathitrust.org/api/volumes/oclc/20848257.html> ;
    schema:url <http://books.google.com/books?id=bC9RAAAAMAAJ> ;
    schema:url <http://link.spie.org/PSISDG/1163/1> ;
    schema:url <http://proceedings.spiedigitallibrary.org/volume.aspx?volume=1163> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/643839677> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/365654606#Meeting/spie_conference_on_fringe_pattern_analysis_1st_1989_san_diego_calif> # SPIE Conference on Fringe Pattern Analysis (1st : 1989 : San Diego, Calif.)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/365654606#Place/san_diego_calif> ; # San Diego, Calif.)
    schema:name "SPIE Conference on Fringe Pattern Analysis (1st : 1989 : San Diego, Calif.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/365654606#Place/bellingham_wash_usa> # Bellingham, Wash., USA
    a schema:Place ;
    schema:name "Bellingham, Wash., USA" ;
    .

<http://experiment.worldcat.org/entity/work/data/365654606#Place/san_diego_calif> # San Diego, Calif.)
    a schema:Place ;
    schema:name "San Diego, Calif.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/365654606#Series/proceedings_spie_the_international_society_for_optical_engineering> # Proceedings / SPIE--the International Society for Optical Engineering ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/643839677> ; # Fringe pattern analysis : 8-9 August 1989, San Diego, California
    schema:name "Proceedings / SPIE--the International Society for Optical Engineering ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/365654606#Topic/diffraction_patterns> # DIFFRACTION PATTERNS
    a schema:Intangible ;
    schema:name "DIFFRACTION PATTERNS"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/365654606#Topic/speckle_interferometry> # SPECKLE INTERFEROMETRY
    a schema:Intangible ;
    schema:name "SPECKLE INTERFEROMETRY"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85037932> # Diffraction patterns
    a schema:Intangible ;
    schema:name "Diffraction patterns"@en ;
    .

<http://id.worldcat.org/fast/893521> # Diffraction patterns
    a schema:Intangible ;
    schema:name "Diffraction patterns"@en ;
    .

<http://id.worldcat.org/fast/967501> # Image processing
    a schema:Intangible ;
    schema:name "Image processing"@en ;
    .

<http://id.worldcat.org/fast/976235> # Interferometry
    a schema:Intangible ;
    schema:name "Interferometry"@en ;
    .

<http://viaf.org/viaf/151856603> # Society of Photo-optical Instrumentation Engineers.
    a schema:Organization ;
    schema:name "Society of Photo-optical Instrumentation Engineers." ;
    .

<http://viaf.org/viaf/38536794> # Graeme T. Reid
    a schema:Person ;
    schema:familyName "Reid" ;
    schema:givenName "Graeme T." ;
    schema:name "Graeme T. Reid" ;
    .

<http://worldcat.org/issn/0277-786X> # Proceedings of SPIE--the International Society for Optical Engineering ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/643839677> ; # Fringe pattern analysis : 8-9 August 1989, San Diego, California
    schema:issn "0277-786X" ;
    schema:name "Proceedings of SPIE--the International Society for Optical Engineering ;" ;
    .

<http://www.worldcat.org/oclc/20848257>
    a schema:CreativeWork ;
    rdfs:label "Fringe pattern analysis." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/643839677> ; # Fringe pattern analysis : 8-9 August 1989, San Diego, California
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.