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Frontiers in reliability : a volume commemorating the first 25 years of the Indian Association for Productivity, Quality, and Reliability

Author: Asit P Basu; Shyamaprasad Mukhopadhyay; Sujit K Basu; Indian Association for Productivity, Quality, and Reliability.
Publisher: Singapore ; River Edge, NJ : World Scientific, ©1998.
Series: Series on quality, reliability & engineering statistics, vol. 4.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:
This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability.
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Document Type: Book
All Authors / Contributors: Asit P Basu; Shyamaprasad Mukhopadhyay; Sujit K Basu; Indian Association for Productivity, Quality, and Reliability.
ISBN: 9810233604 9789810233600
OCLC Number: 38014249
Description: xi, 435 pages : illustrations ; 26 cm.
Contents: Purnendu Kumar Bose: A Brief Biography --
Bayesian Approach Using Nonhomogeneous Poisson Processes for Software Reliability Models / J.A. Achcar, D.K. Dey and M. Niverthi --
Bayesian Estimation of the Number of Undetected Errors When Both Reviewers and Errors are Heterogeneous / Sanjib Basu --
Class of Life Distributions that are Laplace Order Dominated by the Exponential Law and Its Ramifications / Sujit K. Basu and Murari Mitra --
Recent Applications of the plotting Technique / Bo Bergman and Bengt Klefsjo --
Dynamic Programming, Renewal Functions, and Perfect vs. Minimal Repair Comparisons / M.C. Bhattacharjee --
TTT-Transform Characterization of the NBRUE Property and Tests of Exponentiality / Manish C. Bhattacharjee and Pranab K. Sen.
Series Title: Series on quality, reliability & engineering statistics, vol. 4.
Responsibility: editors, Asit P. Basu, Sujit K. Basu, Shyamaprasad Mukhopadhyay.

Abstract:

This volume presents results in reliability theory. Topics covered include: Bayesian reliability; Bayesian reliability modelling; confounding in a series system; DF tests; Edgeworth approximation to  Read more...

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