skip to content
Fundamentals of exploratory analysis of variance Preview this item
ClosePreview this item
Checking...

Fundamentals of exploratory analysis of variance

Author: David C Hoaglin; Frederick Mosteller; John W Tukey
Publisher: New York : Wiley, ©1991.
Series: Wiley series in probability and mathematical statistics., Applied probability and statistics.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: David C Hoaglin; Frederick Mosteller; John W Tukey
ISBN: 0471527351 9780471527350
OCLC Number: 23180322
Description: xvii, 430 pages : illustrations ; 25 cm.
Series Title: Wiley series in probability and mathematical statistics., Applied probability and statistics.
Responsibility: edited by David C. Hoaglin, Frederick Mosteller, John W. Tukey.
More information:

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/23180322> # Fundamentals of exploratory analysis of variance
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "23180322" ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/365418430#Thing/multivariate_analysis> ; # Multivariate analysis
    schema:about <http://experiment.worldcat.org/entity/work/data/365418430#Topic/variantieanalyse> ; # Variantieanalyse
    schema:about <http://experiment.worldcat.org/entity/work/data/365418430#Topic/analyse_multidimensionnelle_manuel_d_enseignement> ; # Analyse multidimensionnelle--Manuel d'enseignement
    schema:about <http://id.worldcat.org/fast/808330> ; # Analysis of variance
    schema:about <http://experiment.worldcat.org/entity/work/data/365418430#Topic/analyse_de_variance> ; # Analyse de variance
    schema:about <http://dewey.info/class/519.538/e20/> ;
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/108174581> ; # John Wilder Tukey
    schema:contributor <http://viaf.org/viaf/56687426> ; # David Caster Hoaglin
    schema:contributor <http://viaf.org/viaf/108174575> ; # Frederick Mosteller
    schema:copyrightYear "1991" ;
    schema:datePublished "1991" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/365418430> ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://worldcat.org/issn/0271-6356> ; # Wiley series in probability and mathematical statistics.
    schema:name "Fundamentals of exploratory analysis of variance"@en ;
    schema:productID "23180322" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/23180322#PublicationEvent/new_york_wiley_1991> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/365418430#Agent/wiley> ; # Wiley
    schema:url <http://catdir.loc.gov/catdir/toc/onix03/91002407.html> ;
    schema:url <http://www.gbv.de/dms/hbz/toc/ht003983997.PDF> ;
    schema:workExample <http://worldcat.org/isbn/9780471527350> ;
    umbel:isLike <http://bnb.data.bl.uk/id/resource/GB9244603> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/23180322> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/365418430#Thing/multivariate_analysis> # Multivariate analysis
    a schema:Thing ;
    schema:name "Multivariate analysis" ;
    .

<http://experiment.worldcat.org/entity/work/data/365418430#Topic/analyse_de_variance> # Analyse de variance
    a schema:Intangible ;
    schema:name "Analyse de variance"@en ;
    schema:name "Analyse de variance"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/365418430#Topic/analyse_multidimensionnelle_manuel_d_enseignement> # Analyse multidimensionnelle--Manuel d'enseignement
    a schema:Intangible ;
    schema:name "Analyse multidimensionnelle--Manuel d'enseignement"@en ;
    .

<http://id.worldcat.org/fast/808330> # Analysis of variance
    a schema:Intangible ;
    schema:name "Analysis of variance"@en ;
    .

<http://viaf.org/viaf/108174575> # Frederick Mosteller
    a schema:Person ;
    schema:birthDate "1916" ;
    schema:deathDate "2006" ;
    schema:familyName "Mosteller" ;
    schema:givenName "Frederick" ;
    schema:name "Frederick Mosteller" ;
    .

<http://viaf.org/viaf/108174581> # John Wilder Tukey
    a schema:Person ;
    schema:birthDate "1915" ;
    schema:deathDate "2000" ;
    schema:familyName "Tukey" ;
    schema:givenName "John Wilder" ;
    schema:givenName "John W." ;
    schema:name "John Wilder Tukey" ;
    .

<http://viaf.org/viaf/56687426> # David Caster Hoaglin
    a schema:Person ;
    schema:birthDate "1944" ;
    schema:familyName "Hoaglin" ;
    schema:givenName "David Caster" ;
    schema:givenName "David C." ;
    schema:name "David Caster Hoaglin" ;
    .

<http://worldcat.org/isbn/9780471527350>
    a schema:ProductModel ;
    schema:isbn "0471527351" ;
    schema:isbn "9780471527350" ;
    .

<http://worldcat.org/issn/0271-6356> # Wiley series in probability and mathematical statistics.
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/23180322> ; # Fundamentals of exploratory analysis of variance
    schema:issn "0271-6356" ;
    schema:name "Wiley series in probability and mathematical statistics." ;
    schema:name "Wiley series in probability and mathematical statistics. Applied probability and statistics," ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.