skip to content
Fundamentals of powder diffraction and structural characterization of materials Preview this item
ClosePreview this item
Checking...

Fundamentals of powder diffraction and structural characterization of materials

Author: Vitalij K Pecharsky; Peter Y Zavalij
Publisher: New York : Springer, [2005]
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:
Fundamentals of Powder Diffraction and Structural Characterization of Materials provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is  Read more...
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Electronic books
Additional Physical Format: Print version:
Pecharsky, Vitalij K.
Fundamentals of powder diffraction and structural characterization of materials.
New York : Springer, [2005]
(DLC) 2005042474
(OCoLC)57422432
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Vitalij K Pecharsky; Peter Y Zavalij
ISBN: 0387245677 9780387245676
OCLC Number: 209829379
Description: 1 online resource (xxiii, 713 pages) : illustrations
Contents: Fundamentals of Crystalline State --
Fundamentals of Diffraction --
Experimental Techniques --
Preliminary Data Processing and Phase Analysis --
Unit Cell Determination and Refinement --
Crystal Structure Determination. Crystal Structure Refinement --
Index.
Responsibility: by Vitalij K. Pecharsky, Peter Y. Zavalij.
More information:

Abstract:

Provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. This book emphasises on powder diffraction data collected using  Read more...

Reviews

Editorial reviews

Publisher Synopsis

The book is well written and organized. The authorsa (TM) enthusiasm and dedication to the subject matter are clearly evident. I find the book to be not only an excellent introduction to structural Read more...

 
User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/209829379> # Fundamentals of powder diffraction and structural characterization of materials
    a schema:Book, schema:CreativeWork, schema:MediaObject ;
    library:oclcnum "209829379" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    schema:about <http://experiment.worldcat.org/entity/work/data/757478#Topic/science_des_materiaux> ; # Science des matériaux
    schema:about <http://experiment.worldcat.org/entity/work/data/757478#Topic/powders_optical_properties_measurement> ; # Powders--Optical properties--Measurement
    schema:about <http://experiment.worldcat.org/entity/work/data/757478#Topic/powder_diffraction> ; # Powder Diffraction
    schema:about <http://experiment.worldcat.org/entity/work/data/757478#Topic/cristalografia> ; # Cristalografia
    schema:about <http://experiment.worldcat.org/entity/work/data/757478#Topic/chimie> ; # Chimie
    schema:about <http://experiment.worldcat.org/entity/work/data/757478#Topic/difracao_por_raios_x> ; # Difração por raios x
    schema:about <http://dewey.info/class/548.83/e22/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/757478#Topic/crystallography_x_ray> ; # Crystallography, X-Ray
    schema:about <http://experiment.worldcat.org/entity/work/data/757478#Topic/x_rays_diffraction_measurement> ; # X-rays--Diffraction--Measurement
    schema:about <http://id.worldcat.org/fast/1181820> ; # X-ray crystallography
    schema:about <http://id.worldcat.org/fast/1074183> ; # Powders--Optical properties--Measurement
    schema:about <http://id.worldcat.org/fast/1181863> ; # X-rays--Diffraction--Measurement
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/164260120> ; # Peter Y. Zavalij
    schema:creator <http://viaf.org/viaf/161300937> ; # Vitalij K. Pecharsky
    schema:datePublished "2005" ;
    schema:description "Fundamentals of Powder Diffraction and Structural Characterization of Materials provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters one though three give essential theoretical background, while chapters four through seven guide the reader through practical aspects of extracting structural information from powder data. In addition color electronic versions of some 300 illustrations found throughout the book will be included. The book is designed for both the undergraduate and graduate students from materials science, solid-state chemistry, physics, geology, and literally any other science or engineering background, who demand structural information at the atomic resolution. Key features: The book requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. The book is useful for any scientific or engineering background, where precise structural information is required. The book comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Particular attention is paid to the utilization of the Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data."@en ;
    schema:description "Fundamentals of Crystalline State -- Fundamentals of Diffraction -- Experimental Techniques -- Preliminary Data Processing and Phase Analysis -- Unit Cell Determination and Refinement -- Crystal Structure Determination. Crystal Structure Refinement -- Index."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/757478> ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/57422432> ;
    schema:name "Fundamentals of powder diffraction and structural characterization of materials"@en ;
    schema:productID "209829379" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/209829379#PublicationEvent/new_york_springer_2005> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/757478#Agent/springer> ; # Springer
    schema:url <http://dx.doi.org/10.1007/b106242> ;
    schema:url <http://www.myilibrary.com?id=133460> ;
    schema:url <http://link.library.utoronto.ca/eir/EIRdetail.cfm?Resources__ID=746348&T=F> ;
    schema:url <http://site.ebrary.com/id/10229237> ;
    schema:url <http://swbplus.bsz-bw.de/bsz119433885cov.htm> ;
    schema:url <https://www.gbv.de/dms/bowker/toc/9780387241470.pdf> ;
    schema:url <http://swbplus.bsz-bw.de/bsz264332741cov.htm> ;
    schema:url <http://rave.ohiolink.edu/ebooks/ebc/0387245677> ;
    schema:url <http://www.springerlink.com/openurl.asp?genre=book&isbn=978-0-387-24147-0> ;
    schema:workExample <http://worldcat.org/isbn/9780387245676> ;
    schema:workExample <http://dx.doi.org/10.1007/b106242> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/209829379> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/757478#Topic/crystallography_x_ray> # Crystallography, X-Ray
    a schema:Intangible ;
    schema:name "Crystallography, X-Ray"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/757478#Topic/difracao_por_raios_x> # Difração por raios x
    a schema:Intangible ;
    schema:name "Difração por raios x"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/757478#Topic/powder_diffraction> # Powder Diffraction
    a schema:Intangible ;
    schema:name "Powder Diffraction"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/757478#Topic/powders_optical_properties_measurement> # Powders--Optical properties--Measurement
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh85105963> ;
    schema:name "Powders--Optical properties--Measurement"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/757478#Topic/science_des_materiaux> # Science des matériaux
    a schema:Intangible ;
    schema:name "Science des matériaux"@en ;
    .

<http://id.worldcat.org/fast/1074183> # Powders--Optical properties--Measurement
    a schema:Intangible ;
    schema:name "Powders--Optical properties--Measurement"@en ;
    .

<http://id.worldcat.org/fast/1181820> # X-ray crystallography
    a schema:Intangible ;
    schema:name "X-ray crystallography"@en ;
    .

<http://id.worldcat.org/fast/1181863> # X-rays--Diffraction--Measurement
    a schema:Intangible ;
    schema:name "X-rays--Diffraction--Measurement"@en ;
    .

<http://viaf.org/viaf/161300937> # Vitalij K. Pecharsky
    a schema:Person ;
    schema:familyName "Pecharsky" ;
    schema:givenName "Vitalij K." ;
    schema:name "Vitalij K. Pecharsky" ;
    .

<http://viaf.org/viaf/164260120> # Peter Y. Zavalij
    a schema:Person ;
    schema:familyName "Zavalij" ;
    schema:givenName "Peter Y." ;
    schema:name "Peter Y. Zavalij" ;
    .

<http://worldcat.org/isbn/9780387245676>
    a schema:ProductModel ;
    schema:isbn "0387245677" ;
    schema:isbn "9780387245676" ;
    .

<http://www.worldcat.org/oclc/57422432>
    a schema:CreativeWork ;
    rdfs:label "Fundamentals of powder diffraction and structural characterization of materials." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/209829379> ; # Fundamentals of powder diffraction and structural characterization of materials
    .

<http://www.worldcat.org/title/-/oclc/209829379>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/209829379> ; # Fundamentals of powder diffraction and structural characterization of materials
    schema:dateModified "2016-08-05" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.