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Handbook of charged particle optics
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Handbook of charged particle optics

著者: Jon Orloff
出版商: Boca Raton : CRC Press/Taylor & Francis, ©2009.
版本/格式:   图书 : 英语 : 2nd ed查看所有的版本和格式
提要:

A guide to understanding, designing, and using high resolution probe instrumentation. It offers information for the design and operation of high resolution focused probe instruments. It features  再读一些...

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类型/形式: Handbooks, manuals, etc
材料类型: 互联网资源
文件类型: 书, 互联网资源
所有的著者/提供者: Jon Orloff
ISBN: 9781420045543 1420045547
OCLC号码: 213765926
描述: xi, 665 p., [7] p. of plates : ill. (some col.) ; 27 cm.
内容: Review of ZrO/W Schottky cathode / Lyn W. Swanson, Gregory A. Schwind --
Liquid metal ion sources / Richard G. Forbes, (the late) Graeme L.R. Mair --
Gas field ionization sources / Richard G. Forbes --
Magnetic lenses for electron microscopy / Katsushige Tsuno --
Electrostatic lenses / Bohumila Lencová --
Aberrations / Peter W. Hawkes --
Space charge and statistical coulomb effects / Pieter Kruit, Guus H. Jansen --
Resolution / Mitsugu Sato --
The scanning electron microscope / András E. Vladár, Michael T. Postek --
The scanning transmission electron microscope / Albert V. Crewe; updated by Peter D. Nellist --
Focused ion beams / M. Utlaut --
Aberration correction in electron microscopy / Ondrej L. Krivanek, Niklas Dellby, Matthew F. Murfitt --
Appendix: Computational resources for electron microscopy / J. Orloff; with valuable information from Peter W. Hawkes, Bohumila Lencová.
责任: edited by Jon Orloff.
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! In giving [a] combination of practical and theoretical aspects, the book is a valuable reference when it comes to the design of charged particle optical elements in microscopy such as scanning 再读一些...

 
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