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| 类型/形式： | Handbooks, manuals, etc |
|---|---|
| 材料类型： | 互联网资源 |
| 文件类型： | 书, 互联网资源 |
| 所有的著者/提供者： |
Jon Orloff |
| ISBN: | 9781420045543 1420045547 |
| OCLC号码： | 213765926 |
| 描述： | xi, 665 p., [7] p. of plates : ill. (some col.) ; 27 cm. |
| 内容： | Review of ZrO/W Schottky cathode / Lyn W. Swanson, Gregory A. Schwind -- Liquid metal ion sources / Richard G. Forbes, (the late) Graeme L.R. Mair -- Gas field ionization sources / Richard G. Forbes -- Magnetic lenses for electron microscopy / Katsushige Tsuno -- Electrostatic lenses / Bohumila Lencová -- Aberrations / Peter W. Hawkes -- Space charge and statistical coulomb effects / Pieter Kruit, Guus H. Jansen -- Resolution / Mitsugu Sato -- The scanning electron microscope / András E. Vladár, Michael T. Postek -- The scanning transmission electron microscope / Albert V. Crewe; updated by Peter D. Nellist -- Focused ion beams / M. Utlaut -- Aberration correction in electron microscopy / Ondrej L. Krivanek, Niklas Dellby, Matthew F. Murfitt -- Appendix: Computational resources for electron microscopy / J. Orloff; with valuable information from Peter W. Hawkes, Bohumila Lencová. |
| 责任： | edited by Jon Orloff. |
| 更多信息： |
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出版商概要
! In giving [a] combination of practical and theoretical aspects, the book is a valuable reference when it comes to the design of charged particle optical elements in microscopy such as scanning electron microscopes or scanning transmission electron microscopes. ! The index is very comprehensive and helps in making the book a valuable reference. Although the text comes from 18 different authors each with their individual style, it is nevertheless well written and clear throughout. The eight unnumbered colour pages at the centre of the book are also a nice feature. Altogether, the book is valuable for experts and those who want to become experts concerned with the design and understanding of charged particle optics as used in electron microscopy. Owing to the rigorous mathematical treatment of particle optical effects, it will also help in the analysis of observed effects such as aberrations and their correction, space charge effects, as well as issues concerning the resolution obtained in microscopy. --Manuel Vogel, Contemporary Physics, Vol. 51, Issue 4, July 2010 再读一些...