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Handbook of charged particle optics

Author: Jon Orloff
Publisher: Boca Raton : CRC Press/Taylor & Francis, ©2009.
Edition/Format:   eBook : Document : English : 2nd edView all editions and formats
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A guide to understanding, designing, and using high resolution probe instrumentation. It offers information for the design and operation of high resolution focused probe instruments. It features  Read more...

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Genre/Form: Electronic books
Handbooks and manuals
Handbooks, manuals, etc
Additional Physical Format: Print version:
Handbook of charged particle optics.
Boca Raton : CRC Press/Taylor & Francis, ©2009
(DLC) 2008013026
(OCoLC)213765926
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Jon Orloff
ISBN: 9781420045550 1420045555
OCLC Number: 316214680
Description: 1 online resource (xi, 665 pages, [7] pages of plates) : illustrations (some color)
Contents: Review of ZrO/W Schottky cathode / Lyn W. Swanson, Gregory A. Schwind --
Liquid metal ion sources / Richard G. Forbes, (the late) Graeme L.R. Mair --
Gas field ionization sources / Richard G. Forbes --
Magnetic lenses for electron microscopy / Katsushige Tsuno --
Electrostatic lenses / Bohumila Lencová --
Aberrations / Peter W. Hawkes --
Space charge and statistical coulomb effects / Pieter Kruit, Guus H. Jansen --
Resolution / Mitsugu Sato --
The scanning electron microscope / András E. Vladár, Michael T. Postek --
The scanning transmission electron microscope / Albert V. Crewe; updated by Peter D. Nellist --
Focused ion beams / M. Utlaut --
Aberration correction in electron microscopy / Ondrej L. Krivanek, Niklas Dellby, Matthew F. Murfitt --
Appendix: Computational resources for electron microscopy / J. Orloff; with valuable information from Peter W. Hawkes, Bohumila Lencová.
Responsibility: edited by Jon Orloff.
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... In giving [a] combination of practical and theoretical aspects, the book is a valuable reference when it comes to the design of charged particle optical elements in microscopy such as scanning Read more...

 
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