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Handbook of optical metrology : principles and applications

Auteur: Tōru Yoshizawa
Uitgever: Boca Raton : CRC Press, ©2009.
Editie/Formaat:   Gedrukt boek : EngelsAlle edities en materiaalsoorten bekijken.
Samenvatting:
"The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked a comprehensive handbook, one providing an overview of optical metrology that covers practical  Meer lezen...
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Genre/Vorm: Handbooks and manuals
Aufsatzsammlung
Handbooks, manuals, etc
Genre: Internetbron
Soort document Boek, Internetbron
Alle auteurs / medewerkers: Tōru Yoshizawa
ISBN: 9780849337604 0849337607
OCLC-nummer: 149650317
Beschrijving: xiii, 730 pages : illustrations ; 27 cm
Inhoud: Part I: Fundamentals of optical elements and devices --
Light sources / Natalia Dushkina --
Lenses, prisms, and mirrors / Peter R. Hall --
Optoelectronic sensors / Motohiro Suyama --
Optical devices and optomechanical elements / Akihiko Chaki, Kenji Magara --
Part II: Fundamentals of principles and techniques for metrology --
Propagation of light / Natalie Dushkina --
Interferometry / David A. Page --
Holography / Giancarlo Pedrini --
Speckle methods and applications / Nandigana Krishna Mohan --
Moire Metrology / Lianhua Jin --
Optical heterodyne measurement method / Masao Hiramo --
Diffraction / Toru Yoshizawa --
Light scattering / Lev T. Perelman --
Polarization / Michael Shribak --
Near-field optics / Wenhao Huang, Xi Li, Guoyong Zhang --
Length and size / René Schödel --
Part III: Practical applications --
Displacement / Akiko Hirai, Mariko Kajima, Souichi Telada --
Straightness and alignment / Ruedi Thalmann --
Flatness / Toshiyuki Takatsuji, Youichi Bitou --
Surface profilometry / Toru Yoshizawa, Toshitaka Wakayama --
Three-dimensional shape measurement / Frank Chen, Gordon M. Brown, Mumin Song --
Fringe analysis / Jun-ichi Kato --
Photogrammetry / Nobuo Kochi --
Optical methods in solid mechanics / Anand Asundi --
Optical methods in flow management / Sang Joon Lee --
Polarimetry / Baoliang Wang --
Birefringence measurement / Yukitoshi Otani --
Ellipsometry / Hiroyuki Fujiwara --
Optical thin film and coatings / Chen-Chung Lee, Shigetaro Ogura --
Film surface and thickness profilometry / Katsuichi Kitagawa --
On-machine measurements / Takashi Nomura, Kazuhide Kamiya.
Verantwoordelijkheid: edited by Toru Yoshizawa.
Meer informatie

Fragment:

Discusses fundamental principles and techniques, exploring practical applications of optical methods. This handbook contains thirty chapters divided into three sections such as: Fundamental of  Meer lezen...

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Primary Entity

<http://www.worldcat.org/oclc/149650317> # Handbook of optical metrology : principles and applications
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "149650317" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/flu> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/800783094#Place/boca_raton> ; # Boca Raton
    schema:about <http://dewey.info/class/681.25/e22/> ;
    schema:about <http://id.loc.gov/authorities/subjects/sh2001008470> ; # Metrology
    schema:about <http://experiment.worldcat.org/entity/work/data/800783094#Topic/optische_messung> ; # Optische Messung
    schema:about <http://experiment.worldcat.org/entity/work/data/800783094#Topic/metrologie> ; # Metrologie
    schema:about <http://experiment.worldcat.org/entity/work/data/800783094#Topic/matteknik> ; # Mätteknik
    schema:about <http://id.worldcat.org/fast/1046776> ; # Optical measurements
    schema:about <http://id.loc.gov/authorities/subjects/sh85095156> ; # Optical measurements
    schema:about <http://id.worldcat.org/fast/1018841> ; # Metrology
    schema:about <http://experiment.worldcat.org/entity/work/data/800783094#Topic/matinstrument_teknik> ; # Mätinstrument--teknik
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/262241570> ; # Tōru Yoshizawa
    schema:copyrightYear "2009" ;
    schema:datePublished "2009" ;
    schema:description "Part I: Fundamentals of optical elements and devices -- Light sources / Natalia Dushkina -- Lenses, prisms, and mirrors / Peter R. Hall -- Optoelectronic sensors / Motohiro Suyama -- Optical devices and optomechanical elements / Akihiko Chaki, Kenji Magara -- Part II: Fundamentals of principles and techniques for metrology -- Propagation of light / Natalie Dushkina -- Interferometry / David A. Page -- Holography / Giancarlo Pedrini -- Speckle methods and applications / Nandigana Krishna Mohan -- Moire Metrology / Lianhua Jin -- Optical heterodyne measurement method / Masao Hiramo -- Diffraction / Toru Yoshizawa -- Light scattering / Lev T. Perelman -- Polarization / Michael Shribak -- Near-field optics / Wenhao Huang, Xi Li, Guoyong Zhang -- Length and size / René Schödel -- Part III: Practical applications -- Displacement / Akiko Hirai, Mariko Kajima, Souichi Telada -- Straightness and alignment / Ruedi Thalmann -- Flatness / Toshiyuki Takatsuji, Youichi Bitou -- Surface profilometry / Toru Yoshizawa, Toshitaka Wakayama -- Three-dimensional shape measurement / Frank Chen, Gordon M. Brown, Mumin Song -- Fringe analysis / Jun-ichi Kato -- Photogrammetry / Nobuo Kochi -- Optical methods in solid mechanics / Anand Asundi -- Optical methods in flow management / Sang Joon Lee -- Polarimetry / Baoliang Wang -- Birefringence measurement / Yukitoshi Otani -- Ellipsometry / Hiroyuki Fujiwara -- Optical thin film and coatings / Chen-Chung Lee, Shigetaro Ogura -- Film surface and thickness profilometry / Katsuichi Kitagawa -- On-machine measurements / Takashi Nomura, Kazuhide Kamiya."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/800783094> ;
    schema:genre "Handbooks and manuals"@en ;
    schema:genre "Aufsatzsammlung"@en ;
    schema:inLanguage "en" ;
    schema:name "Handbook of optical metrology : principles and applications"@en ;
    schema:productID "149650317" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/149650317#PublicationEvent/boca_raton_crc_press_2009> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/800783094#Agent/crc_press> ; # CRC Press
    schema:reviews <http://www.worldcat.org/title/-/oclc/149650317#Review/815041178> ;
    schema:url <http://catdir.loc.gov/catdir/toc/fy0904/2008037129.html> ;
    schema:url <http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017155510&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA> ;
    schema:url <http://www.crcnetbase.com/isbn/9780849337604> ;
    schema:url <http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017155510&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA> ;
    schema:workExample <http://worldcat.org/isbn/9780849337604> ;
    umbel:isLike <http://bnb.data.bl.uk/id/resource/GBA8C8682> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/149650317> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/800783094#Topic/matinstrument_teknik> # Mätinstrument--teknik
    a schema:Intangible ;
    schema:name "Mätinstrument--teknik"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2001008470> # Metrology
    a schema:Intangible ;
    schema:name "Metrology"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85095156> # Optical measurements
    a schema:Intangible ;
    schema:name "Optical measurements"@en ;
    .

<http://id.worldcat.org/fast/1018841> # Metrology
    a schema:Intangible ;
    schema:name "Metrology"@en ;
    .

<http://id.worldcat.org/fast/1046776> # Optical measurements
    a schema:Intangible ;
    schema:name "Optical measurements"@en ;
    .

<http://viaf.org/viaf/262241570> # Tōru Yoshizawa
    a schema:Person ;
    schema:birthDate "1939" ;
    schema:familyName "Yoshizawa" ;
    schema:givenName "Tōru" ;
    schema:name "Tōru Yoshizawa" ;
    .

<http://worldcat.org/isbn/9780849337604>
    a schema:ProductModel ;
    schema:isbn "0849337607" ;
    schema:isbn "9780849337604" ;
    .

<http://www.worldcat.org/title/-/oclc/149650317#Review/815041178>
    a schema:Review ;
    schema:itemReviewed <http://www.worldcat.org/oclc/149650317> ; # Handbook of optical metrology : principles and applications
    schema:reviewBody ""The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals." "Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications." "With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter, which makes this a valuable reference for all those involved with optical metrology."--Jacket." ;
    .


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