pular para conteúdo
Handbook of optical metrology : principles and applications Ver prévia deste item
FecharVer prévia deste item
Checando...

Handbook of optical metrology : principles and applications

Autor: Tōru Yoshizawa
Editora: Boca Raton : CRC Press, ©2009.
Edição/Formato   Print book : InglêsVer todas as edições e formatos
Base de Dados:WorldCat
Resumo:
"The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked a comprehensive handbook, one providing an overview of optical metrology that covers practical  Ler mais...
Classificação:

(ainda não classificado) 0 com críticas - Seja o primeiro.

Assuntos
Mais como este

 

Encontrar uma cópia on-line

Links para este item

Encontrar uma cópia na biblioteca

&AllPage.SpinnerRetrieving; Encontrando bibliotecas que possuem este item...

Detalhes

Gênero/Forma: Handbooks and manuals
Aufsatzsammlung
Handbooks, manuals, etc
Tipo de Material: Recurso Internet
Tipo de Documento: Livro, Recurso Internet
Todos os Autores / Contribuintes: Tōru Yoshizawa
ISBN: 9780849337604 0849337607
Número OCLC: 149650317
Descrição: xiii, 730 pages : illustrations ; 27 cm
Conteúdos: Part I: Fundamentals of optical elements and devices --
Light sources / Natalia Dushkina --
Lenses, prisms, and mirrors / Peter R. Hall --
Optoelectronic sensors / Motohiro Suyama --
Optical devices and optomechanical elements / Akihiko Chaki, Kenji Magara --
Part II: Fundamentals of principles and techniques for metrology --
Propagation of light / Natalie Dushkina --
Interferometry / David A. Page --
Holography / Giancarlo Pedrini --
Speckle methods and applications / Nandigana Krishna Mohan --
Moire Metrology / Lianhua Jin --
Optical heterodyne measurement method / Masao Hiramo --
Diffraction / Toru Yoshizawa --
Light scattering / Lev T. Perelman --
Polarization / Michael Shribak --
Near-field optics / Wenhao Huang, Xi Li, Guoyong Zhang --
Length and size / René Schödel --
Part III: Practical applications --
Displacement / Akiko Hirai, Mariko Kajima, Souichi Telada --
Straightness and alignment / Ruedi Thalmann --
Flatness / Toshiyuki Takatsuji, Youichi Bitou --
Surface profilometry / Toru Yoshizawa, Toshitaka Wakayama --
Three-dimensional shape measurement / Frank Chen, Gordon M. Brown, Mumin Song --
Fringe analysis / Jun-ichi Kato --
Photogrammetry / Nobuo Kochi --
Optical methods in solid mechanics / Anand Asundi --
Optical methods in flow management / Sang Joon Lee --
Polarimetry / Baoliang Wang --
Birefringence measurement / Yukitoshi Otani --
Ellipsometry / Hiroyuki Fujiwara --
Optical thin film and coatings / Chen-Chung Lee, Shigetaro Ogura --
Film surface and thickness profilometry / Katsuichi Kitagawa --
On-machine measurements / Takashi Nomura, Kazuhide Kamiya.
Responsabilidade: edited by Toru Yoshizawa.
Mais informações:

Resumo:

Discusses fundamental principles and techniques, exploring practical applications of optical methods. This handbook contains thirty chapters divided into three sections such as: Fundamental of  Ler mais...

Críticas

Críticas contribuídas por usuários
Recuperando críticas GoodReas...
Recuperando comentários DOGObooks

Etiquetas

Seja o primeiro.

Ítens Similares

Assuntos Relacionados:(8)

Listas de usuários com este item (3)

Confirmar esta solicitação

Você já pode ter solicitado este item. Por favor, selecione Ok se gostaria de proceder com esta solicitação de qualquer forma.

Dados Ligados


Primary Entity

<http://www.worldcat.org/oclc/149650317> # Handbook of optical metrology : principles and applications
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "149650317" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/flu> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/800783094#Place/boca_raton> ; # Boca Raton
   schema:about <http://experiment.worldcat.org/entity/work/data/800783094#Topic/metrology> ; # Metrology
   schema:about <http://dewey.info/class/681.25/e22/> ;
   schema:about <http://id.loc.gov/authorities/subjects/sh2001008470> ; # Metrology
   schema:about <http://experiment.worldcat.org/entity/work/data/800783094#Topic/optical_measurements> ; # Optical measurements
   schema:about <http://experiment.worldcat.org/entity/work/data/800783094#Topic/optische_messung> ; # Optische Messung
   schema:about <http://experiment.worldcat.org/entity/work/data/800783094#Topic/metrologie> ; # Metrologie
   schema:about <http://experiment.worldcat.org/entity/work/data/800783094#Topic/matteknik> ; # Mätteknik
   schema:about <http://id.worldcat.org/fast/1046776> ; # Optical measurements
   schema:about <http://id.loc.gov/authorities/subjects/sh85095156> ; # Optical measurements
   schema:about <http://id.worldcat.org/fast/1018841> ; # Metrology
   schema:about <http://experiment.worldcat.org/entity/work/data/800783094#Topic/matinstrument_teknik> ; # Mätinstrument--teknik
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/262241570> ; # Tōru Yoshizawa
   schema:copyrightYear "2009" ;
   schema:datePublished "2009" ;
   schema:description "Part I: Fundamentals of optical elements and devices -- Light sources / Natalia Dushkina -- Lenses, prisms, and mirrors / Peter R. Hall -- Optoelectronic sensors / Motohiro Suyama -- Optical devices and optomechanical elements / Akihiko Chaki, Kenji Magara -- Part II: Fundamentals of principles and techniques for metrology -- Propagation of light / Natalie Dushkina -- Interferometry / David A. Page -- Holography / Giancarlo Pedrini -- Speckle methods and applications / Nandigana Krishna Mohan -- Moire Metrology / Lianhua Jin -- Optical heterodyne measurement method / Masao Hiramo -- Diffraction / Toru Yoshizawa -- Light scattering / Lev T. Perelman -- Polarization / Michael Shribak -- Near-field optics / Wenhao Huang, Xi Li, Guoyong Zhang -- Length and size / René Schödel -- Part III: Practical applications -- Displacement / Akiko Hirai, Mariko Kajima, Souichi Telada -- Straightness and alignment / Ruedi Thalmann -- Flatness / Toshiyuki Takatsuji, Youichi Bitou -- Surface profilometry / Toru Yoshizawa, Toshitaka Wakayama -- Three-dimensional shape measurement / Frank Chen, Gordon M. Brown, Mumin Song -- Fringe analysis / Jun-ichi Kato -- Photogrammetry / Nobuo Kochi -- Optical methods in solid mechanics / Anand Asundi -- Optical methods in flow management / Sang Joon Lee -- Polarimetry / Baoliang Wang -- Birefringence measurement / Yukitoshi Otani -- Ellipsometry / Hiroyuki Fujiwara -- Optical thin film and coatings / Chen-Chung Lee, Shigetaro Ogura -- Film surface and thickness profilometry / Katsuichi Kitagawa -- On-machine measurements / Takashi Nomura, Kazuhide Kamiya."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/800783094> ;
   schema:genre "Handbooks and manuals"@en ;
   schema:genre "Aufsatzsammlung"@en ;
   schema:inLanguage "en" ;
   schema:name "Handbook of optical metrology : principles and applications"@en ;
   schema:productID "149650317" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/149650317#PublicationEvent/boca_raton_crc_press_2009> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/800783094#Agent/crc_press> ; # CRC Press
   schema:reviews <http://www.worldcat.org/title/-/oclc/149650317#Review/815041178> ;
   schema:url <http://catdir.loc.gov/catdir/toc/fy0904/2008037129.html> ;
   schema:url <http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017155510&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA> ;
   schema:url <http://www.crcnetbase.com/isbn/9780849337604> ;
   schema:url <http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=017155510&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA> ;
   schema:workExample <http://worldcat.org/isbn/9780849337604> ;
   umbel:isLike <http://bnb.data.bl.uk/id/resource/GBA8C8682> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/149650317> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/800783094#Topic/matinstrument_teknik> # Mätinstrument--teknik
    a schema:Intangible ;
   schema:name "Mätinstrument--teknik"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/800783094#Topic/optical_measurements> # Optical measurements
    a schema:Intangible ;
   schema:name "Optical measurements"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2001008470> # Metrology
    a schema:Intangible ;
   schema:name "Metrology"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85095156> # Optical measurements
    a schema:Intangible ;
   schema:name "Optical measurements"@en ;
    .

<http://id.worldcat.org/fast/1018841> # Metrology
    a schema:Intangible ;
   schema:name "Metrology"@en ;
    .

<http://id.worldcat.org/fast/1046776> # Optical measurements
    a schema:Intangible ;
   schema:name "Optical measurements"@en ;
    .

<http://viaf.org/viaf/262241570> # Tōru Yoshizawa
    a schema:Person ;
   schema:birthDate "1939" ;
   schema:familyName "Yoshizawa" ;
   schema:givenName "Tōru" ;
   schema:name "Tōru Yoshizawa" ;
    .

<http://worldcat.org/isbn/9780849337604>
    a schema:ProductModel ;
   schema:isbn "0849337607" ;
   schema:isbn "9780849337604" ;
    .

<http://www.worldcat.org/title/-/oclc/149650317#Review/815041178>
    a schema:Review ;
   schema:itemReviewed <http://www.worldcat.org/oclc/149650317> ; # Handbook of optical metrology : principles and applications
   schema:reviewBody ""The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals." "Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications." "With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter, which makes this a valuable reference for all those involved with optical metrology."--Jacket." ;
    .


Content-negotiable representations

Close Window

Por favor, conecte-se ao WorldCat 

Não tem uma conta? Você pode facilmente criar uma conta gratuita.