跳到内容
Handbook of optical metrology : principles and applications 预览资料
关闭预览资料
正在查...

Handbook of optical metrology : principles and applications

著者: Tōru Yoshizawa
出版商: Boca Raton : CRC Press, ©2009.
版本/格式:   图书 : 英语查看所有的版本和格式
数据库:WorldCat
提要:

Discusses fundamental principles and techniques, exploring practical applications of optical methods. This handbook contains thirty chapters divided into three sections such as: Fundamental of  再读一些...

评估:

(尚未评估) 0 附有评论 - 争取成为第一个。

主题
更多类似这样的

 

在线查找

与资料的链接

在图书馆查找

&AllPage.SpinnerRetrieving; 正在查找有这资料的图书馆...

详细书目

类型/形式: Aufsatzsammlung
Handbooks, manuals, etc
材料类型: 互联网资源
文件类型: 书, 互联网资源
所有的著者/提供者: Tōru Yoshizawa
ISBN: 9780849337604 0849337607
OCLC号码: 149650317
描述: xiii, 730 p. : ill. ; 27 cm.
内容: Part I: Fundamentals of optical elements and devices --
Light sources / Natalia Dushkina --
Lenses, prisms, and mirrors / Peter R. Hall --
Optoelectronic sensors / Motohiro Suyama --
Optical devices and optomechanical elements / Akihiko Chaki, Kenji Magara --
Part II: Fundamentals of principles and techniques for metrology --
Propagation of light / Natalie Dushkina --
Interferometry / David A. Page --
Holography / Giancarlo Pedrini --
Speckle methods and applications / Nandigana Krishna Mohan --
Moire Metrology / Lianhua Jin --
Optical heterodyne measurement method / Masao Hiramo --
Diffraction / Toru Yoshizawa --
Light scattering / Lev T. Perelman --
Polarization / Michael Shribak --
Near-field optics / Wenhao Huang, Xi Li, Guoyong Zhang --
Length and size / René Schödel --
Part III: Practical applications --
Displacement / Akiko Hirai, Mariko Kajima, Souichi Telada --
Straightness and alignment / Ruedi Thalmann --
Flatness / Toshiyuki Takatsuji, Youichi Bitou --
Surface profilometry / Toru Yoshizawa, Toshitaka Wakayama --
Three-dimensional shape measurement / Frank Chen, Gordon M. Brown, Mumin Song --
Fringe analysis / Jun-ichi Kato --
Photogrammetry / Nobuo Kochi --
Optical methods in solid mechanics / Anand Asundi --
Optical methods in flow management / Sang Joon Lee --
Polarimetry / Baoliang Wang --
Birefringence measurement / Yukitoshi Otani --
Ellipsometry / Hiroyuki Fujiwara --
Optical thin film and coatings / Chen-Chung Lee, Shigetaro Ogura --
Film surface and thickness profilometry / Katsuichi Kitagawa --
On-machine measurements / Takashi Nomura, Kazuhide Kamiya.
责任: edited by Toru Yoshizawa.
更多信息:

评论

用户提供的评论
正在获取GoodReads评论...
正在检索DOGObooks的评论

标签

所有的用户标签 (2)

查看最热门的标签,展示的形式是: 标签列表 | 标签云(tag cloud)

  • bf2010  (由 1 个人)
  • ref  (由 1 个人)

相似资料

相关主题:(6)

这资料的用户列表 (3)

确认申请

你可能已经申请过这份资料。如果还是想申请,请选确认。

链接数据


<http://www.worldcat.org/oclc/149650317>
library:oclcnum"149650317"
library:placeOfPublication
library:placeOfPublication
owl:sameAs<info:oclcnum/149650317>
rdf:typeschema:Book
rdfs:seeAlso
schema:about
schema:about
schema:about
schema:about
schema:about
rdf:typeschema:Intangible
schema:name"Metrology--Handbooks, manuals, etc."
schema:about
schema:about
schema:about
schema:about
rdf:typeschema:Intangible
schema:name"Optical measurements--Handbooks, manuals, etc."
schema:contributor
schema:copyrightYear"2009"
schema:datePublished"2009"
schema:description"Part I: Fundamentals of optical elements and devices -- Light sources / Natalia Dushkina -- Lenses, prisms, and mirrors / Peter R. Hall -- Optoelectronic sensors / Motohiro Suyama -- Optical devices and optomechanical elements / Akihiko Chaki, Kenji Magara -- Part II: Fundamentals of principles and techniques for metrology -- Propagation of light / Natalie Dushkina -- Interferometry / David A. Page -- Holography / Giancarlo Pedrini -- Speckle methods and applications / Nandigana Krishna Mohan -- Moire Metrology / Lianhua Jin -- Optical heterodyne measurement method / Masao Hiramo -- Diffraction / Toru Yoshizawa -- Light scattering / Lev T. Perelman -- Polarization / Michael Shribak -- Near-field optics / Wenhao Huang, Xi Li, Guoyong Zhang -- Length and size / René Schödel -- Part III: Practical applications -- Displacement / Akiko Hirai, Mariko Kajima, Souichi Telada -- Straightness and alignment / Ruedi Thalmann -- Flatness / Toshiyuki Takatsuji, Youichi Bitou -- Surface profilometry / Toru Yoshizawa, Toshitaka Wakayama -- Three-dimensional shape measurement / Frank Chen, Gordon M. Brown, Mumin Song -- Fringe analysis / Jun-ichi Kato -- Photogrammetry / Nobuo Kochi -- Optical methods in solid mechanics / Anand Asundi -- Optical methods in flow management / Sang Joon Lee -- Polarimetry / Baoliang Wang -- Birefringence measurement / Yukitoshi Otani -- Ellipsometry / Hiroyuki Fujiwara -- Optical thin film and coatings / Chen-Chung Lee, Shigetaro Ogura -- Film surface and thickness profilometry / Katsuichi Kitagawa -- On-machine measurements / Takashi Nomura, Kazuhide Kamiya."
schema:exampleOfWork<http://worldcat.org/entity/work/id/800783094>
schema:genre"Handbooks, manuals, etc."
schema:inLanguage"en"
schema:name"Handbook of optical metrology : principles and applications"
schema:numberOfPages"730"
schema:publisher
schema:workExample
schema:workExample
umbel:isLike<http://bnb.data.bl.uk/id/resource/GBA8C8682>

Content-negotiable representations

关闭窗口

请登入WorldCat 

没有张号吗?很容易就可以 建立免费的账号.