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Handbook of quantitative science and technology research : the use of publication and patent statistics in studies of S & T systems

Autor H F Moed; Wolfgang Glänzel; Ulrich Schmoch
Vydavatel: Dordrecht ; London : Kluwer Academic Publishers, ©2004.
Vydání/formát:   book_printbook : EnglishZobrazit všechny vydání a formáty
Databáze:WorldCat
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Offers a survey of quantitative science and technology research. This book focuses on the development and application of indicators derived from data on scientific publications and patents. It deals  Přečíst více...

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Detaily

Žánr/forma: Handbooks, manuals, etc
Guides, manuels, etc
Typ dokumentu: Book
Všichni autoři/tvůrci: H F Moed; Wolfgang Glänzel; Ulrich Schmoch
ISBN: 1402027028 9781402027024 1402027559 9781402027550
OCLC číslo: 56695465
Popis: x, 800 pages : illustrations ; 25 cm
Obsahy: Part 2: General Methodology --
8. Data Mining and Text Mining for Science & Technology Research / Edda Leopold, Michael May, and Gerhard Paaß --
9. Opening the Black Box / Sybille Hinze and Ulrich Schmoch --
10. Science Maps within a Science Policy Context / Ed C.M. Noyons --
11. Analysing Scientific Networks through Co-Authorship / Wolfgang Glänzel and András Schubert --
12. Patent Citations and the Economic Value of Patents / Bhaven N. Sampat and Arvids A. Ziedonis --
13. Scientific and Technological Performance by Gender / Fulvio Naldi, Daniela Luzi, Adriana Valente, and Ilaria Vannini Parenti --
14. The Use of Input Data in the Performance Analysis of R & D Systems / Marc Luwel --
15. Methodological Issues of Webometric Studies / Peter Ingwersen and Lennart Björneborn. Part 3: The Science System --
16. Descriptive versus Evaluative Bibliometrics / Thed van Leeuwen --
17. What Happens when Funding Is Linked to Publication Counts? / Linda Butler --
18. Internationalisation in Science in the Prism of Bibliometric Indicators / Michel Zitt and Elise Bassecoulard --
19. Analysis of Cross-Disciplinary Research through Bibliometric Tools / María Bordons, Fernanda Morillo, and Isabel Gómez --
20. Citations to Papers from Other Documents / Grant Lewison --
21. The Four Literatures of Social Science / Diana Hicks --
22. Evaluation of Research Performance and Scientometric Indicators in China / Bihui Jin and Ronald Rousseau --
23. Decomposing National Trends in Activity and Impact / Olle Persson and Rickard Danell. Part 4: The Technology System --
24. National Patterns of Technology Accumulation: Use of Patent Statistics / Lionel Nesta and Pari Patel --
25. Using Patent Citation Indicators to Manage a Stock Portfolio / Francis Narin, Anthony Breitzman, and Patrick Thomas --
26. Patent Data for Monitoring S & T Portfolios / Koenraad Debackere and Marc Luwel --
27. Patent Profiling for Competitive Advantage / Alan L. Porter and Nils C. Newman --
28. Knowledge Networks from Patent Data / Stefano Breschi and Francesco Lissoni --
29. Measuring the Internationalisation of the Generation of Knowledge / Dominique Guellec and Bruno van Pottelsberghe de la Potterie.
Odpovědnost: edited by Henk F. Moed, Wolfgang Glänzel and Ulrich Schmoch.

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Primary Entity

<http://www.worldcat.org/oclc/56695465> # Handbook of quantitative science and technology research : the use of publication and patent statistics in studies of S & T systems
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "56695465" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/894525061#Place/dordrecht> ; # Dordrecht
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/ne> ;
    library:placeOfPublication <http://dbpedia.org/resource/London> ; # London
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/technology_methodology> ; # Technology--Methodology
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/indicateurs_scientifiques> ; # Indicateurs scientifiques
    schema:about <http://id.loc.gov/authorities/subjects/sh2009102806> ; # Technology--Methodology
    schema:about <http://id.loc.gov/authorities/subjects/sh85118668> ; # Science indicators
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/natuurwetenschappen> ; # Natuurwetenschappen
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/science_methodology> ; # Science--Methodology
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/kwantitatieve_methoden> ; # Kwantitatieve methoden
    schema:about <http://id.loc.gov/authorities/subjects/sh85118577> ; # Science--Methodology
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/technologie> ; # Technologie
    schema:about <http://dewey.info/class/502.8/e22/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/onderzoeksmethoden> ; # Onderzoeksmethoden
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/research_evaluation> ; # Research--Evaluation
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/technisch_onderzoek> ; # Technisch onderzoek
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/sciences_methodologie> ; # Sciences--Méthodologie
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/science_indicators> ; # Science indicators
    schema:about <http://id.loc.gov/authorities/subjects/sh85113024> ; # Research--Evaluation
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/recherche_evaluation> ; # Recherche--Évaluation
    schema:about <http://experiment.worldcat.org/entity/work/data/894525061#Topic/technologie_methodologie> ; # Technologie--Méthodologie
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/61871397> ; # H. F. Moed
    schema:contributor <http://viaf.org/viaf/25020344> ; # Wolfgang Glänzel
    schema:contributor <http://viaf.org/viaf/20286152> ; # Ulrich Schmoch
    schema:copyrightYear "2004" ;
    schema:datePublished "2004" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/894525061> ;
    schema:genre "Handbooks, manuals, etc."@en ;
    schema:inLanguage "en" ;
    schema:name "Handbook of quantitative science and technology research : the use of publication and patent statistics in studies of S & T systems"@en ;
    schema:productID "56695465" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/56695465#PublicationEvent/dordrecht_london_kluwer_academic_publishers_2004> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/894525061#Agent/kluwer_academic_publishers> ; # Kluwer Academic Publishers
    schema:workExample <http://worldcat.org/isbn/9781402027550> ;
    schema:workExample <http://worldcat.org/isbn/9781402027024> ;
    umbel:isLike <http://bnb.data.bl.uk/id/resource/GBA471242> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/56695465> ;
    .


Related Entities

<http://dbpedia.org/resource/London> # London
    a schema:Place ;
    schema:name "London" ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Agent/kluwer_academic_publishers> # Kluwer Academic Publishers
    a bgn:Agent ;
    schema:name "Kluwer Academic Publishers" ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/indicateurs_scientifiques> # Indicateurs scientifiques
    a schema:Intangible ;
    schema:name "Indicateurs scientifiques"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/kwantitatieve_methoden> # Kwantitatieve methoden
    a schema:Intangible ;
    schema:name "Kwantitatieve methoden"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/natuurwetenschappen> # Natuurwetenschappen
    a schema:Intangible ;
    schema:name "Natuurwetenschappen"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/onderzoeksmethoden> # Onderzoeksmethoden
    a schema:Intangible ;
    schema:name "Onderzoeksmethoden"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/recherche_evaluation> # Recherche--Évaluation
    a schema:Intangible ;
    schema:name "Recherche--Évaluation"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/research_evaluation> # Research--Evaluation
    a schema:Intangible ;
    schema:name "Research--Evaluation"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/science_indicators> # Science indicators
    a schema:Intangible ;
    schema:name "Science indicators"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/science_methodology> # Science--Methodology
    a schema:Intangible ;
    schema:name "Science--Methodology"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/sciences_methodologie> # Sciences--Méthodologie
    a schema:Intangible ;
    schema:name "Sciences--Méthodologie"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/technisch_onderzoek> # Technisch onderzoek
    a schema:Intangible ;
    schema:name "Technisch onderzoek"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/technologie_methodologie> # Technologie--Méthodologie
    a schema:Intangible ;
    schema:name "Technologie--Méthodologie"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/894525061#Topic/technology_methodology> # Technology--Methodology
    a schema:Intangible ;
    schema:name "Technology--Methodology"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2009102806> # Technology--Methodology
    a schema:Intangible ;
    schema:name "Technology--Methodology"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85113024> # Research--Evaluation
    a schema:Intangible ;
    schema:name "Research--Evaluation"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85118577> # Science--Methodology
    a schema:Intangible ;
    schema:name "Science--Methodology"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85118668> # Science indicators
    a schema:Intangible ;
    schema:name "Science indicators"@en ;
    .

<http://viaf.org/viaf/20286152> # Ulrich Schmoch
    a schema:Person ;
    schema:familyName "Schmoch" ;
    schema:givenName "Ulrich" ;
    schema:name "Ulrich Schmoch" ;
    .

<http://viaf.org/viaf/25020344> # Wolfgang Glänzel
    a schema:Person ;
    schema:familyName "Glänzel" ;
    schema:givenName "Wolfgang" ;
    schema:name "Wolfgang Glänzel" ;
    .

<http://viaf.org/viaf/61871397> # H. F. Moed
    a schema:Person ;
    schema:familyName "Moed" ;
    schema:givenName "H. F." ;
    schema:name "H. F. Moed" ;
    .

<http://worldcat.org/isbn/9781402027024>
    a schema:ProductModel ;
    schema:description "cased" ;
    schema:isbn "1402027028" ;
    schema:isbn "9781402027024" ;
    .

<http://worldcat.org/isbn/9781402027550>
    a schema:Book, schema:ProductModel ;
    schema:bookFormat schema:EBook ;
    schema:isbn "1402027559" ;
    schema:isbn "9781402027550" ;
    .

<http://www.worldcat.org/title/-/oclc/56695465>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/56695465> ; # Handbook of quantitative science and technology research : the use of publication and patent statistics in studies of S & T systems
    schema:dateModified "2015-04-09" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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