| 内容： |
Introduction, J. C. Riviere and S. Myhra Problem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. Riviere Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. Hoflund Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. Rading Surface and Interface Analysis by Scanning Probe Microscopy, S. Myhra Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments J. M. Titchmarsh Synchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. Prince Quantifi cation of Surface and Near-Surface Composition by AES and XPS, S. Tougaard Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. Titchmarsh In-Depth Analysis/Profiling, F. Reniers and C. R. Tewell Characterization of Nanostructured Materials, M. Werner, A. Crossley, and C. Johnston Problem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. Martin Problem-Solving Methods in Surface Analysis Metallurgy, R. K. Wild Composites, P. M. A. Sherwood Minerals, Ceramics, and Glasses, R. St. C. Smart and Z. Zhang Catalyst Characterization, W. E. S. Unger and T. Gross Surface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. Griesser Adhesion Science and Technology, J. F. Watts Electron Spectroscopy in Corrosion Science, J. E. Castle |
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图书 : 英语 : 2nd ed