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High quality test pattern generation and boolean satisfiability

Author: Stephan Eggersglüss; Rolf Drechsler
Publisher: New York : Springer, ©2012.
Edition/Format:   eBook : Document : EnglishView all editions and formats
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Stephan Eggersglüss; Rolf Drechsler
ISBN: 9781441999764 1441999760
OCLC Number: 775669206
Description: 1 online resource (xviii, 193 pages)
Contents: Part I: Preliminaries and Previous Work --
Circuits and Testing --
Boolean Satisfiability --
ATPG Based on Boolean Satisfiability --
Part II: New SAT Techniques and their Application in ATPG --
Dynamic Clause Activation --
Circuit-based Dynamic Learning --
Part III: High Quality Delay Test Generation --
High Quality ATPG for Transition Faults --
Path Delay Fault Model --
Summary and Outlook.
Responsibility: Stephan Eggersglüß, Rolf Drechsler.

Abstract:

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and  Read more...

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