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High-Resolution Electron Microscopy for Materials Science

Author: Daisuke Shindo; Kenji Hiraga
Publisher: Tokyo : Springer Japan, 1998.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Daisuke Shindo; Kenji Hiraga
ISBN: 9784431684220 4431684220
OCLC Number: 851379332
Description: 1 online resource (ix, 190 pages 203 illustrations)
Contents: Basis of Transmission Electron Microscopy: Principles of Transmission Electron Microscopy. Electron Scattering and Fourier Transformation. Formation of High-Resolution Electron Microscopy. Computer Simulation of High-Resolution Electron Microscopy --
Practice of High-Resolution Electron Microscopy: Classifications of High-Resolution Electron Microscope Images. Practice of High-Resolution Electron Microscope Observation --
Application of High-Resolution Electron Microscopy: High-Resolution Electron Microscope Images of Lattice Defects, Surface and Interface. High-Resolution Electron Microscope Images of Various Materials. Peripheral Instruments and Techniques for High-Resolution Electron Microscopy: Image Processing. Quantitative Analysis. Electron Diffraction. Weak Beam Technique. Evaluation of Characteristic Parameters of Electron Microscopes. Specimen Preparation Techniques --
Appendix.
Responsibility: by Daisuke Shindo, Kenji Hiraga.

Abstract:

Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are  Read more...

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