skip to content
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. Preview this item
ClosePreview this item
Checking...

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.

Author: Robert Sinclair, (Materials scientist); David J Smith; Ulrich Dahmen; Materials Research Society.
Publisher: Pittsburgh, Pa. : Materials Research Society, ©1990.
Series: Materials Research Society symposia proceedings, v. 183.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
Summary:

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
High resolution electron microscopy of defects in materials.
Pittsburgh, Pa. : Materials Research Society, ©1990
(OCoLC)555718585
Online version:
High resolution electron microscopy of defects in materials.
Pittsburgh, Pa. : Materials Research Society, ©1990
(OCoLC)607647591
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Robert Sinclair, (Materials scientist); David J Smith; Ulrich Dahmen; Materials Research Society.
ISBN: 1558990720 9781558990722
OCLC Number: 22117610
Description: xi, 391 pages : illustrations ; 24 cm.
Series Title: Materials Research Society symposia proceedings, v. 183.
Responsibility: editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/22117610> # High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "22117610" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/365227019#Place/pittsburgh_pa> ; # Pittsburgh, Pa.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/pau> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/365227019#Topic/materials_microscopy> ; # Materials--Microscopy
   schema:about <http://experiment.worldcat.org/entity/work/data/365227019#Topic/materials_defects> ; # Materials--Defects
   schema:about <http://experiment.worldcat.org/entity/work/data/365227019#Topic/high_resolution_electron_microscopy_congresses> ; # High resolution electron microscopy--Congresses
   schema:about <http://experiment.worldcat.org/entity/work/data/365227019#Topic/materials_congresses_microscopy> ; # Materials--Congresses--Microscopy
   schema:about <http://experiment.worldcat.org/entity/work/data/365227019#Topic/materials_congresses_defects> ; # Materials--Congresses--Defects
   schema:about <http://id.loc.gov/authorities/subjects/sh2003009914> ; # High resolution electron microscopy
   schema:about <http://id.worldcat.org/fast/956062> ; # High resolution electron microscopy
   schema:about <http://id.worldcat.org/fast/1011856> ; # Materials--Microscopy
   schema:about <http://id.worldcat.org/fast/1011798> ; # Materials--Defects
   schema:about <http://dewey.info/class/620.11299/e20/> ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://experiment.worldcat.org/entity/work/data/365227019#Organization/materials_research_society> ; # Materials Research Society.
   schema:contributor <http://experiment.worldcat.org/entity/work/data/365227019#Person/smith_david_j_1948> ; # David J. Smith
   schema:contributor <http://experiment.worldcat.org/entity/work/data/365227019#Person/dahmen_ulrich> ; # Ulrich Dahmen
   schema:contributor <http://experiment.worldcat.org/entity/work/data/365227019#Person/sinclair_robert_materials_scientist> ; # (Materials scientist) Robert Sinclair
   schema:copyrightYear "1990" ;
   schema:datePublished "1990" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/365227019> ;
   schema:genre "Conference publication"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/365227019#Series/materials_research_society_symposia_proceedings> ; # Materials Research Society symposia proceedings ;
   schema:isPartOf <http://worldcat.org/issn/0272-9172> ; # Materials Research Society symposium proceedings,
   schema:isSimilarTo <http://www.worldcat.org/oclc/607647591> ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/555718585> ;
   schema:name "High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A."@en ;
   schema:productID "22117610" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/22117610#PublicationEvent/pittsburgh_pa_materials_research_society_1990> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/365227019#Agent/materials_research_society> ; # Materials Research Society
   schema:workExample <http://worldcat.org/isbn/9781558990722> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/22117610> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/365227019#Agent/materials_research_society> # Materials Research Society
    a bgn:Agent ;
   schema:name "Materials Research Society" ;
    .

<http://experiment.worldcat.org/entity/work/data/365227019#Organization/materials_research_society> # Materials Research Society.
    a schema:Organization ;
   schema:name "Materials Research Society." ;
    .

<http://experiment.worldcat.org/entity/work/data/365227019#Person/dahmen_ulrich> # Ulrich Dahmen
    a schema:Person ;
   schema:familyName "Dahmen" ;
   schema:givenName "Ulrich" ;
   schema:name "Ulrich Dahmen" ;
    .

<http://experiment.worldcat.org/entity/work/data/365227019#Person/sinclair_robert_materials_scientist> # (Materials scientist) Robert Sinclair
    a schema:Person ;
   schema:familyName "Sinclair" ;
   schema:givenName "Robert" ;
   schema:name "(Materials scientist) Robert Sinclair" ;
    .

<http://experiment.worldcat.org/entity/work/data/365227019#Person/smith_david_j_1948> # David J. Smith
    a schema:Person ;
   schema:birthDate "1948" ;
   schema:familyName "Smith" ;
   schema:givenName "David J." ;
   schema:name "David J. Smith" ;
    .

<http://experiment.worldcat.org/entity/work/data/365227019#Place/pittsburgh_pa> # Pittsburgh, Pa.
    a schema:Place ;
   schema:name "Pittsburgh, Pa." ;
    .

<http://experiment.worldcat.org/entity/work/data/365227019#Series/materials_research_society_symposia_proceedings> # Materials Research Society symposia proceedings ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/22117610> ; # High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.
   schema:name "Materials Research Society symposia proceedings ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/365227019#Topic/high_resolution_electron_microscopy_congresses> # High resolution electron microscopy--Congresses
    a schema:Intangible ;
   schema:name "High resolution electron microscopy--Congresses"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/365227019#Topic/materials_congresses_defects> # Materials--Congresses--Defects
    a schema:Intangible ;
   schema:name "Materials--Congresses--Defects"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/365227019#Topic/materials_congresses_microscopy> # Materials--Congresses--Microscopy
    a schema:Intangible ;
   schema:name "Materials--Congresses--Microscopy"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2003009914> # High resolution electron microscopy
    a schema:Intangible ;
   schema:name "High resolution electron microscopy"@en ;
    .

<http://id.worldcat.org/fast/1011798> # Materials--Defects
    a schema:Intangible ;
   schema:name "Materials--Defects"@en ;
    .

<http://id.worldcat.org/fast/1011856> # Materials--Microscopy
    a schema:Intangible ;
   schema:name "Materials--Microscopy"@en ;
    .

<http://id.worldcat.org/fast/956062> # High resolution electron microscopy
    a schema:Intangible ;
   schema:name "High resolution electron microscopy"@en ;
    .

<http://worldcat.org/isbn/9781558990722>
    a schema:ProductModel ;
   schema:isbn "1558990720" ;
   schema:isbn "9781558990722" ;
    .

<http://worldcat.org/issn/0272-9172> # Materials Research Society symposium proceedings,
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/22117610> ; # High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.
   schema:issn "0272-9172" ;
   schema:name "Materials Research Society symposium proceedings," ;
    .

<http://www.worldcat.org/oclc/555718585>
    a schema:CreativeWork ;
   rdfs:label "High resolution electron microscopy of defects in materials." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/22117610> ; # High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.
    .

<http://www.worldcat.org/oclc/607647591>
    a schema:CreativeWork ;
   rdfs:label "High resolution electron microscopy of defects in materials." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/22117610> ; # High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.
    .

<http://www.worldcat.org/title/-/oclc/22117610>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/22117610> ; # High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A.
   schema:dateModified "2016-05-09" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.