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High-resolution electron microscopy

Author: John C H Spence
Publisher: Oxford [u.a.] : Oxford Univ. Press, 2013.
Edition/Format:   Computer file : English : 4. ed
Summary:

This book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, together with highly practical advice for electron microscope operators. It  Read more...

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Material Type: Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: John C H Spence
ISBN: 9780191749322 019174932X 9780199668632 0199668639
OCLC Number: 915913455
Accession No: (DE-604)BV042731506
Notes: Bis 2. Aufl. u.d.T.: Spence, John C.: Experimental high-resolution electron microscopy.
Description: 1 online resource (XIX, 406 S. :) Ill., graph. Darst.
Contents: 1. Preliminaries ; 2. Electron Optics ; 3. Wave Optics ; 4. Coherence and Fourier Optics ; 5. Imaging Thin Crystals and their Defects ; 6. Imaging Molecules: Radiation Damage ; 7. Image Processing, Super-Resolution, Diffractive Imaging ; 8. STEM and Z-contrast ; 9. Electron Sources and Detectors ; 10. Measurement of Electron-Optical Parameters ; 11. Instabilities and the Microscope Environment ; 12. Experimental Methods ; 13. Associated Techniques and Software Resources ; Appendices
Responsibility: John C. H. Spence.

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... Essential reading for anyone interested in HREM and its applications in materials characterization. The fourth edition provides much needed updates on aberration correction and the latest Read more...

 
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Primary Entity

<http://www.worldcat.org/oclc/915913455> # High-resolution electron microscopy
    a bgn:ComputerFile, schema:CreativeWork ;
   library:oclcnum "915913455" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/5092352625#Place/oxford_u_a> ; # Oxford u.a.
   rdfs:comment "Warning: This malformed URI has been treated as a string - 'http://'" ;
   schema:about <http://experiment.worldcat.org/entity/work/data/5092352625#Topic/elektronenmikroskopie> ; # Elektronenmikroskopie
   schema:about <http://experiment.worldcat.org/entity/work/data/5092352625#Topic/durchstrahlungselektronenmikroskopie> ; # Durchstrahlungselektronenmikroskopie
   schema:about <http://experiment.worldcat.org/entity/work/data/5092352625#Topic/hochauflosendes_verfahren> ; # Hochauflösendes Verfahren
   schema:bookEdition "4. ed." ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/5092352625#Person/spence_john_c_h> ; # John C. H. Spence
   schema:datePublished "2013" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/5092352625> ;
   schema:inLanguage "en" ;
   schema:name "High-resolution electron microscopy" ;
   schema:productID "915913455" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/915913455#PublicationEvent/oxford_u_a_oxford_univ_press_2013> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/5092352625#Agent/oxford_univ_press> ; # Oxford Univ. Press
   schema:url <http://www.oxfordscholarship.com/view/10.1093/acprof:oso/9780199668632.001.0001/acprof-9780199668632> ;
   schema:url "http://" ;
   schema:workExample <http://worldcat.org/isbn/9780191749322> ;
   schema:workExample <http://worldcat.org/isbn/9780199668632> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/915913455> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/5092352625#Agent/oxford_univ_press> # Oxford Univ. Press
    a bgn:Agent ;
   schema:name "Oxford Univ. Press" ;
    .

<http://experiment.worldcat.org/entity/work/data/5092352625#Topic/durchstrahlungselektronenmikroskopie> # Durchstrahlungselektronenmikroskopie
    a schema:Intangible ;
   schema:name "Durchstrahlungselektronenmikroskopie" ;
    .

<http://experiment.worldcat.org/entity/work/data/5092352625#Topic/elektronenmikroskopie> # Elektronenmikroskopie
    a schema:Intangible ;
   schema:name "Elektronenmikroskopie" ;
    .

<http://experiment.worldcat.org/entity/work/data/5092352625#Topic/hochauflosendes_verfahren> # Hochauflösendes Verfahren
    a schema:Intangible ;
   schema:name "Hochauflösendes Verfahren" ;
    .

<http://worldcat.org/isbn/9780191749322>
    a schema:ProductModel ;
   schema:isbn "019174932X" ;
   schema:isbn "9780191749322" ;
    .

<http://worldcat.org/isbn/9780199668632>
    a schema:ProductModel ;
   schema:isbn "0199668639" ;
   schema:isbn "9780199668632" ;
    .


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