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Hybrid microcircuit reliability data

Author: IIT Research Institute.
Publisher: Oxford ; New York : Pergamon Press, 1976.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:
Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated  Read more...
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Genre/Form: Electronic books
Datensammlung
Additional Physical Format: Print version:
IIT Research Institute.
Hybrid microcircuit reliability data
(DLC) 75029637
(OCoLC)2159388
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IIT Research Institute.
ISBN: 9781483138275 1483138275
OCLC Number: 881847531
Description: 1 online resource (208 pages)
Contents: Front Cover ; Hybrid Microcircuit Reliability Data; Copyright Page; Table of Contents; INTRODUCTION; SECTION 1. EXPERIENCED vs PREDICTED FAILURE RATES; SECTION 2. SCREENING SUMMARY; SECTION 3. FAILURE CLASSIFICATIONS; SECTION 4. CROSS REFERENCE INDEX; SECTION 5. DETAILED TEST DATA TABULATION; APPENDIX; HYBRID MICROCIRCUIT DESCRIPTOR CODE INTERPRETATIONS
Responsibility: prepared by IIT Research Institute.

Abstract:

Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use.

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