skip to content
ICMTS 1991 : proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan Preview this item
ClosePreview this item
Checking...

ICMTS 1991 : proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan

Author: IEEE Electron Devices Society.
Publisher: New York : IEEE ; Piscataway, NJ : IEEE Service Center [distributor], ©1991.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
IEEE International Conference on Microelectronic Test Structures (1991 : Kyoto, Japan).
ICMTS 1991.
New York : IEEE ; Piscataway, NJ : IEEE Service Center [distributor], ©1991
(DLC) 90082543
(OCoLC)24060995
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Electron Devices Society.
OCLC Number: 47881150
Notes: "91CH2907-4."
Description: 1 online resource (xii, 264 pages) : illustrations
Other Titles: Proceedings of the 1991 International Conference on Microelectronic Test Structures
Proceedings of the International Conference on Microelectronic Test Structures
Microelectronic Test Structures 1991, ICMTS 1991, proceedings of the 1991 International Conference on
Responsibility: sponsored by the IEEE Electron Devices Society.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/47881150> # ICMTS 1991 : proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan
    a schema:CreativeWork, schema:Book, schema:MediaObject ;
    library:oclcnum "47881150" ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/25008342#Place/piscataway_nj> ; # Piscataway, NJ
    rdfs:comment "Warning: This malformed URI has been treated as a string - 'https://libproxy.library.unt.edu/login?url=https://ieeexplore.ieee.org/servlet/opac?punumber=506";'" ;
    schema:about <http://dewey.info/class/621.381548/e20/> ;
    schema:about <http://id.worldcat.org/fast/975593> ; # Integrated circuits--Testing
    schema:about <http://experiment.worldcat.org/entity/work/data/25008342#Topic/integrated_circuits_testing> ; # Integrated circuits--Testing
    schema:alternateName "Proceedings of the International Conference on Microelectronic Test Structures" ;
    schema:alternateName "Microelectronic Test Structures 1991, ICMTS 1991, proceedings of the 1991 International Conference on" ;
    schema:alternateName "Proceedings of the 1991 International Conference on Microelectronic Test Structures" ;
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/141934020> ; # IEEE Electron Devices Society.
    schema:copyrightYear "1991" ;
    schema:creator <http://experiment.worldcat.org/entity/work/data/25008342#Meeting/ieee_international_conference_on_microelectronic_test_structures_1991_kyoto_japan> ; # IEEE International Conference on Microelectronic Test Structures (1991 : Kyoto, Japan)
    schema:datePublished "1991" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/25008342> ;
    schema:genre "Conference publication"@en ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/24060995> ;
    schema:name "ICMTS 1991 : proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan"@en ;
    schema:productID "47881150" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/47881150#PublicationEvent/new_york_ieee_piscataway_nj_ieee_service_center_distributor_1991> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/25008342#Agent/ieee_service_center_distributor> ; # IEEE Service Center [distributor]
    schema:publisher <http://experiment.worldcat.org/entity/work/data/25008342#Agent/ieee> ; # IEEE
    schema:url "https://libproxy.library.unt.edu/login?url=https://ieeexplore.ieee.org/servlet/opac?punumber=506";" ;
    schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=506> ;
    schema:url <https://proxy.library.carleton.ca/login?url=https://ieeexplore.ieee.org/servlet/opac?punumber=506> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/47881150> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/25008342#Agent/ieee_service_center_distributor> # IEEE Service Center [distributor]
    a bgn:Agent ;
    schema:name "IEEE Service Center [distributor]" ;
    .

<http://experiment.worldcat.org/entity/work/data/25008342#Meeting/ieee_international_conference_on_microelectronic_test_structures_1991_kyoto_japan> # IEEE International Conference on Microelectronic Test Structures (1991 : Kyoto, Japan)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/25008342#Place/kyoto_japan> ; # Kyoto, Japan)
    schema:name "IEEE International Conference on Microelectronic Test Structures (1991 : Kyoto, Japan)" ;
    .

<http://experiment.worldcat.org/entity/work/data/25008342#Place/kyoto_japan> # Kyoto, Japan)
    a schema:Place ;
    schema:name "Kyoto, Japan)" ;
    .

<http://experiment.worldcat.org/entity/work/data/25008342#Place/piscataway_nj> # Piscataway, NJ
    a schema:Place ;
    schema:name "Piscataway, NJ" ;
    .

<http://id.worldcat.org/fast/975593> # Integrated circuits--Testing
    a schema:Intangible ;
    schema:name "Integrated circuits--Testing"@en ;
    .

<http://viaf.org/viaf/141934020> # IEEE Electron Devices Society.
    a schema:Organization ;
    schema:name "IEEE Electron Devices Society." ;
    .

<http://www.worldcat.org/oclc/24060995>
    a schema:CreativeWork ;
    rdfs:label "ICMTS 1991." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/47881150> ; # ICMTS 1991 : proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan
    .

<http://www.worldcat.org/title/-/oclc/47881150>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/47881150> ; # ICMTS 1991 : proceedings of the 1991 International Conference on Microelectronic Test Structures : March 18-20, 1991, Kyoto, Japan
    schema:dateModified "2018-09-23" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.