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ICMTS 1995 : proceedings of the 1995 International Conference on Microelectronic Test Structures : March 22-25, 1995, Nara, Japan

Author: IEEE Electron Devices Society.
Publisher: Piscataway, N.J. : IEEE Service Center, ©1995.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Electron Devices Society.
ISBN: 0780320654 9780780320659 0780320662 9780780320666 0780320670 9780780320673
OCLC Number: 32830039
Notes: "IEEE catalog number 95CH3480-1"--Title page verso.
Description: xii, 304 pages : illustrations ; 30 cm
Other Titles: Microelectronic Test Structures, 1995, ICMTS 1995, proceedings of the 1995 International Conference on.
Proceedings of the 1995 International Conference on Microelectronic Test Structures
Proceedings of the International Conference on Microelectronic Test Structures
1995 IEEE International Conference on Microelectronic Test Structures
Responsibility: sponsored by the IEEE Electron Devices Society.

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