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IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1 : IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM). Preview this item
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IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1 : IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM).

Publisher: [S.l.] : IEEE, 2015.
Edition/Format:   eBook : Document
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Genre/Form: Electronic books
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
OCLC Number: 956664609
Notes: Title from content provider.
Description: 1 online resource.

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