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IECI annual conference proceedings, 1976 : papers presented at IECI '76, "Industrial applications of microprocessors, process measurement, and failure mode analysis," Philadelphia, Pennsylvania, March 8-10, 1976

Author: Institute of Electrical and Electronics Engineers. Industrial Electronics and Control Instrumentation Group.
Publisher: New York : Institute of Electrical and Electronics Engineers, ©1976.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Additional Physical Format: Online version:
Institute of Electrical and Electronics Engineers. Industrial Electronics and Control Instrumentation Group.
IECI annual conference proceedings, 1976.
New York : Institute of Electrical and Electronics Engineers, ©1976
(OCoLC)752411779
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Institute of Electrical and Electronics Engineers. Industrial Electronics and Control Instrumentation Group.
OCLC Number: 2681075
Description: viii, 127 p. : ill. ; 29 cm.
Other Titles: Industrial applications of microprocessors, process measurement, and failure mode analysis.
Responsibility: sponsored by the Industrial Electronics and Control Instrumentation Group.

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<http://www.worldcat.org/oclc/2681075> # IECI annual conference proceedings, 1976 : papers presented at IECI '76, "Industrial applications of microprocessors, process measurement, and failure mode analysis," Philadelphia, Pennsylvania, March 8-10, 1976
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "2681075" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/5855737#CreativeWork/industrial_applications_of_microprocessors_process_measurement_and_failure_mode_analysis> ; # Industrial applications of microprocessors, process measurement, and failure mode analysis.
    schema:about <http://id.worldcat.org/fast/1020008> ; # Microprocessors
    schema:about <http://experiment.worldcat.org/entity/work/data/5855737#Topic/microprocesseurs_congres> ; # Microprocesseurs--Congrès
    schema:about <http://experiment.worldcat.org/entity/work/data/5855737#Topic/process_control_congresses> ; # Process control--Congresses
    schema:about <http://experiment.worldcat.org/entity/work/data/5855737#Topic/microprocessors_congresses> ; # Microprocessors--Congresses
    schema:about <http://id.worldcat.org/fast/1078020> ; # Process control
    schema:about <http://dewey.info/class/658.53/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/5855737#Topic/fabrication_controle_congres> ; # Fabrication--Contrôle--Congrès
    schema:bookFormat bgn:PrintBook ;
    schema:copyrightYear "1976" ;
    schema:creator <http://viaf.org/viaf/127280062> ; # Institute of Electrical and Electronics Engineers. Industrial Electronics and Control Instrumentation Group.
    schema:datePublished "1976" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/5855737> ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Conference publication"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/752411779> ;
    schema:name "IECI annual conference proceedings, 1976 : papers presented at IECI '76, "Industrial applications of microprocessors, process measurement, and failure mode analysis," Philadelphia, Pennsylvania, March 8-10, 1976"@en ;
    schema:numberOfPages "127" ;
    schema:productID "2681075" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/2681075#PublicationEvent/new_york_institute_of_electrical_and_electronics_engineers_c1976> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/5855737#Agent/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/2681075> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/5855737#Agent/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers
    a bgn:Agent ;
    schema:name "Institute of Electrical and Electronics Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/5855737#CreativeWork/industrial_applications_of_microprocessors_process_measurement_and_failure_mode_analysis> # Industrial applications of microprocessors, process measurement, and failure mode analysis.
    a schema:CreativeWork ;
    schema:name "Industrial applications of microprocessors, process measurement, and failure mode analysis." ;
    .

<http://experiment.worldcat.org/entity/work/data/5855737#Topic/fabrication_controle_congres> # Fabrication--Contrôle--Congrès
    a schema:Intangible ;
    schema:name "Fabrication--Contrôle--Congrès"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/5855737#Topic/microprocesseurs_congres> # Microprocesseurs--Congrès
    a schema:Intangible ;
    schema:name "Microprocesseurs--Congrès"@fr ;
    .

<http://id.worldcat.org/fast/1020008> # Microprocessors
    a schema:Intangible ;
    schema:name "Microprocessors"@en ;
    .

<http://id.worldcat.org/fast/1078020> # Process control
    a schema:Intangible ;
    schema:name "Process control"@en ;
    .

<http://viaf.org/viaf/127280062> # Institute of Electrical and Electronics Engineers. Industrial Electronics and Control Instrumentation Group.
    a schema:Organization ;
    schema:name "Institute of Electrical and Electronics Engineers. Industrial Electronics and Control Instrumentation Group." ;
    .

<http://www.worldcat.org/oclc/752411779>
    a schema:CreativeWork ;
    rdfs:label "IECI annual conference proceedings, 1976." ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/2681075> ; # IECI annual conference proceedings, 1976 : papers presented at IECI '76, "Industrial applications of microprocessors, process measurement, and failure mode analysis," Philadelphia, Pennsylvania, March 8-10, 1976
    .

<http://www.worldcat.org/title/-/oclc/2681075>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/2681075> ; # IECI annual conference proceedings, 1976 : papers presented at IECI '76, "Industrial applications of microprocessors, process measurement, and failure mode analysis," Philadelphia, Pennsylvania, March 8-10, 1976
    schema:dateModified "2016-08-27" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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