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IEEE guide for digital test interchange format (DTIF) application

Author: IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electric Systems.; Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.
Publisher: New York : Institute of Electrical and Electronics Engineers, 2001.
Series: Institute of Electrical and Electronics Engineers.; IEEE std.
Edition/Format:   eBook : Document : EnglishView all editions and formats
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Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electric Systems.; Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.
ISBN: 0738126276 9780738126272 0738126284 9780738126289
OCLC Number: 50224006
Notes: "IEEE Std 1546-2000."
"Approved 21 September 2000, IEEE-SA Standards Board."
"23 March 2001"--Cover.
Description: 1 online resource (v, 32 pages) : illustrations
Series Title: Institute of Electrical and Electronics Engineers.; IEEE std.
Other Titles: IEEE Std 1546-2000.
Guide for digital test interchange format (DTIF) application
Responsibility: sponsor, IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electric Systems.

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