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IEEE International Reliability Physics Symposium proceedings.

Author: International Reliability Physics Symposium.; IEEE Electron Devices Society.; IEEE Reliability Society.; IEEE Xplore (Online service)
Publisher: New York : Institute of Electrical and Electronics Engineers, ©1974-
Edition/Format:   Journal, magazine : Conference publication : Microfiche : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Congresses
Material Type: Conference publication, Internet resource
Document Type: Journal / Magazine / Newspaper, Internet Resource
All Authors / Contributors: International Reliability Physics Symposium.; IEEE Electron Devices Society.; IEEE Reliability Society.; IEEE Xplore (Online service)
ISSN:0735-0791
OCLC Number: 213807928
Notes: Imprint varies: Piscataway, N.J., <2002->
Title varies slightly; some vols. issued with title: IEEE international reliability physics proceedings; Annual proceedings, reliability physics, etc.
Reproduction Notes: Microfiche. [s.l. : s.n.] microfiches ; 11 x 15 cm.
Description: v. : ill. ; 28 cm.
Other Titles: Reliability physics
Annual proceedings
IEEE international reliability physics proceedings
Annual proceedings, reliability physics
IEEE International Reliability Physics Symposium
Proceedings
International Reliability Physics Symposium proceedings

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