Home

WorldCat Home About WorldCat Help Get E-mail Updates Feedback

Search

Search for Library Items Search for Lists Search for Contacts Search for a Library

Create lists, bibliographies and reviews: or

Cite/Export

Cite/Export

Copy a citation

APA (6th ed.)

Chicago (Author-Date, 15th ed.)

Harvard (18th ed.)

MLA (7th ed.)

Turabian (6th ed.)

Export a citation
Export to RefWorks Export to EndNote / Reference Manager Export to EasyBib Cancel
Note: Citations are based on reference standards. However, formatting rules can vary widely between applications and fields of interest or study. The specific requirements or preferences of your reviewing publisher, classroom teacher, institution or organization should be applied.
Print
E-mail

E-mail

All fields are required.

The E-mail Address(es) field is required. Please enter recipient e-mail address(es).

The E-mail Address(es) you entered is(are) not in a valid format. Please re-enter recipient e-mail address(es).

You may send this item to up to five recipients.
Enter recipient e-mail address(es): Separate up to five addresses with commas (,)
The name field is required. Please enter your name.
Enter your name: Subject:
The E-mail message field is required. Please enter the message.
E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/213807928 Title: IEEE International Reliability Physics Symposium proceedings. Publisher: New York : Institute of Electrical and Electronics Engineers, ©1974- ISBN/ISSN: 0735-0791 OCLC:213807928

The ReCaptcha terms you entered were incorrect. Please try to match the 2 words shown in the window, or try the audio version.

Cancel
Share
Permalink

Permalink

Copy this URL to link to this page:

Write a review
Rate this item:
- 1
- 2
- 3
- 4
- 5

IEEE International Reliability Physics Symposium proceedings.

Preview this item

More like this

Subjects

Similar Items

IEEE International Reliability Physics Symposium proceedings.

Author:	International Reliability Physics Symposium.; IEEE Electron Devices Society.; IEEE Reliability Society.; IEEE Xplore (Online service)
Publisher:	New York : Institute of Electrical and Electronics Engineers, ©1974-
Edition/Format:	Journal, magazine : Conference publication : Microfiche : EnglishView all editions and formats
Rating:	(not yet rated) 0 with reviews - Be the first.
Search this publication for other articles with the following words:

Borrow / obtain a copy

Find a copy online

Links to this item

1988- Enter keywords in search box: Reliability physics

Find a copy in the library

Finding libraries that hold this item...

Details

Genre/Form:	Congresses
Material Type:	Conference publication, Internet resource
Document Type:	Journal / Magazine / Newspaper, Internet Resource
All Authors / Contributors:	International Reliability Physics Symposium.; IEEE Electron Devices Society.; IEEE Reliability Society.; IEEE Xplore (Online service)
ISSN:	0735-0791
OCLC Number:	213807928
Notes:	Imprint varies: Piscataway, N.J., <2002-> Title varies slightly; some vols. issued with title: IEEE international reliability physics proceedings; Annual proceedings, reliability physics, etc.
Description:	v. : ill. ; 28 cm.
Other Titles:	Reliability physics Annual proceedings IEEE international reliability physics proceedings Annual proceedings, reliability physics IEEE International Reliability Physics Symposium Proceedings International Reliability Physics Symposium proceedings

Reviews

User-contributed reviews

Retrieving GoodReads reviews...

Tags

Be the first.

Similar Items

Related Subjects:(4)

Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data

More info about Linked Data

<http://www.worldcat.org/oclc/213807928>

library:oclcnum

"213807928"

library:placeOfPublication

<http://id.loc.gov/vocabulary/countries/nju>

library:placeOfPublication

rdf:type	schema:Place
schema:name	"New York"

<info:oclcnum/213807928>

library:Periodical

schema:CreativeWork/Periodical

<http://id.worldcat.org/fast/1093646>

rdf:type	schema:Intangible
schema:name	"Reliability (Engineering)"

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/subjects/sh85067117>
rdf:type	schema:Intangible
schema:name	"Integrated circuits--Reliability (Engineering)--Congresses."

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/subjects/sh85042383>
rdf:type	schema:Intangible
schema:name	"Electronics--Reliability (Engineering)--Congresses."

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/subjects/sh2008110659>
rdf:type	schema:Intangible
schema:name	"Reliability (Engineering)"

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/subjects/sh85119903>
rdf:type	schema:Intangible
schema:name	"Semiconductors--Reliability (Engineering)--Congresses."

rdf:type	schema:Organization
schema:name	"International Reliability Physics Symposium."

schema:contributor

<http://viaf.org/viaf/169402490>

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/names/n81070856>
rdf:type	schema:Organization
schema:name	"IEEE Electron Devices Society."

schema:contributor

<http://viaf.org/viaf/141252038>

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/names/n81121804>
rdf:type	schema:Organization
schema:name	"IEEE Reliability Society."

schema:contributor

<http://viaf.org/viaf/139825222>

madsrdf:isIdentifiedByAuthority	<http://id.loc.gov/authorities/names/no00037063>
rdf:type	schema:Organization
schema:name	"IEEE Xplore (Online service)"

schema:copyrightYear

"1974"

schema:datePublished

"1974/9999"

schema:inLanguage

"en"

"IEEE International Reliability Physics Symposium proceedings."

schema:publisher

rdf:type	schema:Organization
schema:name	"Institute of Electrical and Electronics Engineers"

<http://www.worldcat.org/issn/0735-0791>

library:issn	"0735-0791"
owl:sameAs	<urn:ISSN:0735-0791>
rdf:type	library:Serial

Please sign in to WorldCat

Don't have an account? You can easily create a free account.