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IEEE standard for a mixed-signal test bus

Author: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.
Publisher: New York, NY : Institute of Electrical and Electronics Engineers, ©2000.
Series: Institute of Electrical and Electronics Engineers.; IEEE std.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.
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Details

Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.
ISBN: 0738117552 9780738117553 0738117560 9780738117560
OCLC Number: 49704103
Notes: "IEEE Std 1149.4-1999."
"Approved 26 June 1999, IEEE-SA Standards Board."
"28 March 2000"--Cover.
Description: 1 online resource (vi, 78 pages) : illustrations
Series Title: Institute of Electrical and Electronics Engineers.; IEEE std.
Other Titles: IEEE Std 1149.4-1999.
Standard for a mixed-signal test bus
Responsibility: sponsor, Test Technology Technical Committee of the IEEE Computer Society.

Abstract:

The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.

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