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IEEE standard for Automatic Test Markup Language (ATML) for exchanging automatic test information via XML : exchanging test station information

Author: IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.; Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.
Publisher: New York : Institute of Electrical and Electronics Engineers, 1 February 2013. ©2013
Series: IEEE Std.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
Abstract: An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test. Keywords: ATML instance document, automatic test equipment (ATE), Automatic Test Markup Language (ATML), automatic test system (ATS), IEEE  Read more...
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Details

Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.; Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.
ISBN: 9780738181684 0738181684
OCLC Number: 880146797
Notes: "IEEE Std 1671.6-2008."
"Approved 26 September 2008 ; IEEE-SA Standards Board."
"Approved as a Full-Use Standard 5 December 2012 ; IEEE-SA Standards Board."
"Published x month year ; STD98110, STDPD98110"--Page ii.
Description: 1 online resource (viii, 20 pages) : illustrations
Series Title: IEEE Std.
Other Titles: IEEE Std 1671.6-2008.
Standard for Automatic Test Markup Language (ATML) for exchanging automatic test information via XML : exchanging test station information
Responsibility: sponsor, IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.

Abstract:

Abstract: An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test. Keywords: ATML instance document, automatic test equipment (ATE), Automatic Test Markup Language (ATML), automatic test system (ATS), IEEE 1671.6, test station, XML schema.

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