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IEEE Std 660-1986 : IEEE Standard for Semiconductor Memory Test Pattern Language.

Publisher: [S.l.] : IEEE, 1986.
Edition/Format:   eBook : Document
Database:WorldCat
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Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
OCLC Number: 956669980
Notes: Title from content provider.
Description: 1 online resource.

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Primary Entity

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Related Entities

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