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IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.

Author: Institute of Electrical and Electronics Engineers.; IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: New York, NY : Institute of Electrical and Electronics Engineers, ©2001-
Edition/Format:   Journal, magazine : Periodical : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Periodicals
Périodiques
Additional Physical Format: IEEE transactions on device and materials reliability (Online)
(DLC) 2002252571
(OCoLC)48011789
Online version:
IEEE transactions on device and materials reliability
(OCoLC)752427805
Material Type: Periodical, Internet resource
Document Type: Journal / Magazine / Newspaper, Internet Resource
All Authors / Contributors: Institute of Electrical and Electronics Engineers.; IEEE Electron Devices Society.; IEEE Reliability Society.
ISSN:1530-4388
OCLC Number: 44161177
Notes: Title from cover.
Description: v. : ill. ; 28 cm.
Other Titles: IEEE transactions on device and materials reliability
Institute of Electrical and Electronics Engineers transactions on device and materials reliability
Device and materials reliability
T-DMR

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