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IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.

Author: Institute of Electrical and Electronics Engineers.; IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: New York, NY : Institute of Electrical and Electronics Engineers, ©2001-
Edition/Format:   eJournal/eMagazine : Document : Periodical : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Periodicals
Périodiques
Additional Physical Format: (DLC) 00214868
(OCoLC)44161177
Material Type: Document, Periodical, Internet resource
Document Type: Internet Resource, Computer File, Journal / Magazine / Newspaper
All Authors / Contributors: Institute of Electrical and Electronics Engineers.; IEEE Electron Devices Society.; IEEE Reliability Society.
ISSN:1530-4388
OCLC Number: 752427805
Reproduction Notes: Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2011. MiAaHDL
Description: volumes : illustrations ; 28 cm
Details: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Other Titles: Institute of Electrical and Electronics Engineers transactions on device and materials reliability
Device and materials reliability
T-DMR

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