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IEEE transactions on device and materials reliability

Author: IEEE Electron Devices Society.; IEEE Reliability Society (New York, N.Y.)
Publisher: Piscataway, NJ : IEEE.
Edition/Format:   Journal, magazine : EnglishView all editions and formats
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Material Type: Internet resource
Document Type: Journal / Magazine / Newspaper, Internet Resource
All Authors / Contributors: IEEE Electron Devices Society.; IEEE Reliability Society (New York, N.Y.)
ISSN:1558-2574, 1530-4388
OCLC Number: 637706931
Responsibility: a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.

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