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IEEE transactions on reliability

Autor Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability.; IEEE Reliability Group.; IEEE Reliability Society.; American Society for Quality Control. Electronics Division.
Vydavatel: [New York, N.Y. : Institute of Electrical and Electronics Engineers, ©1963-
Vydání/formát:   Časopis : Periodical : EnglishZobrazit všechny vydání a formáty
Databáze:WorldCat
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Detaily

Žánr/forma: Periodicals
Périodiques
Doplňující formát: IEEE transactions on reliability (Online)
(DLC) 2005214278
(OCoLC)44607842
Online version:
IEEE transactions on reliability
(OCoLC)562213690
Online version:
IEEE transactions on reliability
(OCoLC)606215212
Typ materiálu: Periodical, Internetový zdroj
Typ dokumentu: Časopis / noviny, Internet Resource
Všichni autoři/tvůrci: Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability.; IEEE Reliability Group.; IEEE Reliability Society.; American Society for Quality Control. Electronics Division.
ISSN:0018-9529
OCLC číslo: 1752560
Poznámky: Title from cover.
Popis: v. : ill. ; 28 cm.
Jiné tituly: IEEE transactions on reliability
Institute of Electrical and Electronics Engineers transactions on reliability
Transactions on reliability
Reliability
Odpovědnost: Professional Technical Group on Reliability.

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Propojená data


Primary Entity

<http://www.worldcat.org/oclc/1752560> # IEEE transactions on reliability
    a schema:Periodical, schema:CreativeWork ;
   library:oclcnum "1752560" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/375916838#Place/new_york_n_y> ; # New York, N.Y.
   schema:about <http://experiment.worldcat.org/entity/work/data/375916838#Topic/electronic_industries_quality_control> ; # Electronic industries--Quality control
   schema:about <http://id.worldcat.org/fast/907274> ; # Electronic industries--Quality control
   schema:about <http://experiment.worldcat.org/entity/work/data/375916838#Topic/elektrotechniek> ; # Elektrotechniek
   schema:about <http://experiment.worldcat.org/entity/work/data/375916838#Topic/industries_electroniques_qualite_controle> ; # Industries électroniques--Qualité--Contrôle
   schema:about <http://experiment.worldcat.org/entity/work/data/375916838#Topic/betrouwbaarheid> ; # Betrouwbaarheid
   schema:alternateName "Transactions on reliability" ;
   schema:alternateName "Institute of Electrical and Electronics Engineers transactions on reliability" ;
   schema:alternateName "Reliability" ;
   schema:contributor <http://viaf.org/viaf/130455534> ; # Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability.
   schema:contributor <http://experiment.worldcat.org/entity/work/data/375916838#Organization/ieee_reliability_group> ; # IEEE Reliability Group.
   schema:contributor <http://viaf.org/viaf/144864037> ; # American Society for Quality Control. Electronics Division.
   schema:contributor <http://viaf.org/viaf/132537053> ; # IEEE Reliability Society.
   schema:copyrightYear "1963" ;
   schema:datePublished "1963/9999" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/375916838> ;
   schema:genre "Periodicals"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/44607842> ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/606215212> ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/562213690> ;
   schema:name "IEEE transactions on reliability"@en ;
   schema:productID "1752560" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/1752560#PublicationEvent/new_york_n_y_institute_of_electrical_and_electronics_engineers_c1963> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/375916838#Agent/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=24> ;
   schema:workExample <http://worldcat.org/issn/0018-9529> ; # IEEE transactions on reliability
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/1752560> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/375916838#Agent/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers
    a bgn:Agent ;
   schema:name "Institute of Electrical and Electronics Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/375916838#Organization/ieee_reliability_group> # IEEE Reliability Group.
    a schema:Organization ;
   schema:name "IEEE Reliability Group." ;
    .

<http://experiment.worldcat.org/entity/work/data/375916838#Topic/industries_electroniques_qualite_controle> # Industries électroniques--Qualité--Contrôle
    a schema:Intangible ;
   schema:name "Industries électroniques--Qualité--Contrôle"@fr ;
    .

<http://id.worldcat.org/fast/907274> # Electronic industries--Quality control
    a schema:Intangible ;
   schema:name "Electronic industries--Quality control"@en ;
    .

<http://viaf.org/viaf/130455534> # Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability.
    a schema:Organization ;
   schema:name "Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability." ;
    .

<http://viaf.org/viaf/132537053> # IEEE Reliability Society.
    a schema:Organization ;
   schema:name "IEEE Reliability Society." ;
    .

<http://viaf.org/viaf/144864037> # American Society for Quality Control. Electronics Division.
    a schema:Organization ;
   schema:name "American Society for Quality Control. Electronics Division." ;
    .

<http://worldcat.org/issn/0018-9529> # IEEE transactions on reliability
    a schema:Periodical ;
   schema:issn "0018-9529" ;
   schema:name "IEEE transactions on reliability"@en ;
   umbel:isLike <http://worldcat.org/entity/work/id/375916838> ;
    .

<http://www.worldcat.org/oclc/44607842>
    a schema:CreativeWork ;
   rdfs:label "IEEE transactions on reliability (Online)" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/1752560> ; # IEEE transactions on reliability
    .

<http://www.worldcat.org/oclc/562213690>
    a schema:CreativeWork ;
   rdfs:label "IEEE transactions on reliability" ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/1752560> ; # IEEE transactions on reliability
    .

<http://www.worldcat.org/oclc/606215212>
    a schema:CreativeWork ;
   rdfs:label "IEEE transactions on reliability" ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/1752560> ; # IEEE transactions on reliability
    .


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