passa ai contenuti
IEEE transactions on reliability Anteprima di questo documento
ChiudiAnteprima di questo documento
Stiamo controllando…

IEEE transactions on reliability

Autore: Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability.; IEEE Reliability Group.; IEEE Reliability Society.; American Society for Quality Control. Electronics Division.
Editore: [New York, N.Y. : Institute of Electrical and Electronics Engineers, ©1963-
Edizione/Formato:   Rivista, giornale : Periodical : EnglishVedi tutte le edizioni e i formati
Banca dati:WorldCat
Voto:

(non ancora votato) 0 con commenti - Diventa il primo.

Soggetti
Altri come questo

 

Trova una copia online

Collegamenti a questo documento

Trova una copia in biblioteca

&AllPage.SpinnerRetrieving; Stiamo ricercando le biblioteche che possiedono questo documento…

Dettagli

Genere/forma: Periodicals
Périodiques
Informazioni aggiuntive sul formato: IEEE transactions on reliability (Online)
(DLC) 2005214278
(OCoLC)44607842
Online version:
IEEE transactions on reliability
(OCoLC)562213690
Online version:
IEEE transactions on reliability
(OCoLC)606215212
Tipo materiale: Periodical, Risorsa internet
Tipo documento: Rivista / giornale / quotidiano, Internet Resource
Tutti gli autori / Collaboratori: Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability.; IEEE Reliability Group.; IEEE Reliability Society.; American Society for Quality Control. Electronics Division.
ISSN:0018-9529
Numero OCLC: 1752560
Note: Title from cover.
Descrizione: v. : ill. ; 28 cm.
Altri titoli: IEEE transactions on reliability
Institute of Electrical and Electronics Engineers transactions on reliability
Transactions on reliability
Reliability
Responsabilità: Professional Technical Group on Reliability.

Commenti

Commenti degli utenti
Recuperando commenti GoodReads…
Stiamo recuperando commenti DOGObooks

Etichette

Diventa il primo.
Conferma questa richiesta

Potresti aver già richiesto questo documento. Seleziona OK se si vuole procedere comunque con questa richiesta.

Dati collegati


Primary Entity

<http://www.worldcat.org/oclc/1752560> # IEEE transactions on reliability
    a schema:Periodical, schema:CreativeWork ;
   library:oclcnum "1752560" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/375916838#Place/new_york_n_y> ; # New York, N.Y.
   schema:about <http://experiment.worldcat.org/entity/work/data/375916838#Topic/electronic_industries_quality_control> ; # Electronic industries--Quality control
   schema:about <http://id.worldcat.org/fast/907274> ; # Electronic industries--Quality control
   schema:about <http://experiment.worldcat.org/entity/work/data/375916838#Topic/elektrotechniek> ; # Elektrotechniek
   schema:about <http://experiment.worldcat.org/entity/work/data/375916838#Topic/industries_electroniques_qualite_controle> ; # Industries électroniques--Qualité--Contrôle
   schema:about <http://experiment.worldcat.org/entity/work/data/375916838#Topic/betrouwbaarheid> ; # Betrouwbaarheid
   schema:alternateName "Transactions on reliability" ;
   schema:alternateName "Institute of Electrical and Electronics Engineers transactions on reliability" ;
   schema:alternateName "Reliability" ;
   schema:contributor <http://viaf.org/viaf/130455534> ; # Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability.
   schema:contributor <http://viaf.org/viaf/156465090> ; # IEEE Reliability Group.
   schema:contributor <http://viaf.org/viaf/144864037> ; # American Society for Quality Control. Electronics Division.
   schema:contributor <http://viaf.org/viaf/132537053> ; # IEEE Reliability Society.
   schema:copyrightYear "1963" ;
   schema:datePublished "1963/9999" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/375916838> ;
   schema:genre "Periodicals"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/44607842> ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/606215212> ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/562213690> ;
   schema:name "IEEE transactions on reliability"@en ;
   schema:productID "1752560" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/1752560#PublicationEvent/new_york_n_y_institute_of_electrical_and_electronics_engineers_c1963> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/375916838#Agent/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers
   schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=24> ;
   schema:workExample <http://worldcat.org/issn/0018-9529> ; # IEEE transactions on reliability
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/1752560> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/375916838#Agent/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers
    a bgn:Agent ;
   schema:name "Institute of Electrical and Electronics Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/375916838#Topic/industries_electroniques_qualite_controle> # Industries électroniques--Qualité--Contrôle
    a schema:Intangible ;
   schema:name "Industries électroniques--Qualité--Contrôle"@fr ;
    .

<http://id.worldcat.org/fast/907274> # Electronic industries--Quality control
    a schema:Intangible ;
   schema:name "Electronic industries--Quality control"@en ;
    .

<http://viaf.org/viaf/130455534> # Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability.
    a schema:Organization ;
   schema:name "Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability." ;
    .

<http://viaf.org/viaf/132537053> # IEEE Reliability Society.
    a schema:Organization ;
   schema:name "IEEE Reliability Society." ;
    .

<http://viaf.org/viaf/144864037> # American Society for Quality Control. Electronics Division.
    a schema:Organization ;
   schema:name "American Society for Quality Control. Electronics Division." ;
    .

<http://viaf.org/viaf/156465090> # IEEE Reliability Group.
    a schema:Organization ;
   schema:name "IEEE Reliability Group." ;
    .

<http://worldcat.org/issn/0018-9529> # IEEE transactions on reliability
    a schema:Periodical ;
   schema:issn "0018-9529" ;
   schema:name "IEEE transactions on reliability"@en ;
   umbel:isLike <http://worldcat.org/entity/work/id/375916838> ;
    .

<http://www.worldcat.org/oclc/44607842>
    a schema:CreativeWork ;
   rdfs:label "IEEE transactions on reliability (Online)" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/1752560> ; # IEEE transactions on reliability
    .

<http://www.worldcat.org/oclc/562213690>
    a schema:CreativeWork ;
   rdfs:label "IEEE transactions on reliability" ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/1752560> ; # IEEE transactions on reliability
    .

<http://www.worldcat.org/oclc/606215212>
    a schema:CreativeWork ;
   rdfs:label "IEEE transactions on reliability" ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/1752560> ; # IEEE transactions on reliability
    .


Content-negotiable representations

Chiudi finestra

Per favore entra in WorldCat 

Non hai un account? Puoi facilmente crearne uno gratuito.