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Image-based fractal description of microstructures

Author: J M Li; et al
Publisher: Boston : Kluwer Academic Publishers, 2003.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Summary:

Fractal analysis has become an important field in materials science and engineering with applications to theoretical analysis and quantitative description of microstructures of materials. This book  Read more...

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: J M Li; et al
ISBN: 1402075073 9781402075070
OCLC Number: 52251454
Description: xii, 272 p. : ill. ; 24 cm.
Contents: Classification of basic elements in microstructures --
Image and image processing --
Image processing --
Image-based measurement of basic elements --
Parameter estimation --
Relationship between properties and irregularity of microstructures of materials --
Digital Images of Microstructures --
Light optical microscope --
Scanning electron microscope --
Topographical contrast --
Atomic number (compositional) contrast --
Crystallographic orientation contrast --
X-ray contrast --
Transmission electron microscope --
Mass-thickness contrast --
Diffraction contrast --
Phase contrast --
Scanning tunnelling microscope --
Atomic force microscope --
Magnetic force microscope --
Image Processing --
Image pre-processing --
Brightness and contrast transformations --
Image enhancement --
Fourier-based spatial frequency transform --
Non-uniform illumination correction --
Noise and filtration --
Object abstraction --
Edge detection --
Roberts operator --
Sobel Operator --
Kirsch operator --
Laplacian operator --
Microstructural segmentation and classification --
Thresholding operation --
K-average dynamic classification --
Image post-processing --
Distance, perimeter, area and center of mass --
Thinning --
Dilation and erosion --
Fundamental Statistics --
Populations, sampling and probability --
Statistical measures for population --
Mean --
Variance --
Standard deviation --
Coefficient of correlation --
Errors --
Absolute deviation --
Relative deviation --
Residual deviation --
Average deviation --
Standard deviation. Probability distribution --
Normal distribution --
x[superscript 2] distribution --
t-distribution --
F-distribution --
Some useful theorems --
Chebyshev's inequality --
Law of large numbers --
Central limit theorem --
Simple linear regression analysis --
Line-fitting to data: Least-squares regression method --
Curve-fitting to data --
Coefficient of correlation of the linear regression --
Error analysis --
Tests of hypothesis --
Fractal Fundamentals --
Dimension --
Euclidean space --
Topological dimension --
Hausdorff dimension --
Generalized dimension --
Properties of a fractal set --
Self-similarity --
Self-affinity --
Examples of fractals --
Cantor set --
Koch curve --
Sierpinski graphics --
Weierstrass-Mandelbrot curve --
Fractal Brownian motion --
Fractal Brownian motion --
Simulation of FBM profile and surface --
Fractal Measurements of Projection Microstructures --
Length of fractal curve --
Perimeter-area and area-volume relations --
Mass method --
Box-counting method --
Multifractal measurements of cluster growth --
Fractal Measurements of Topographical Images from 3D Surfaces --
Fractal nature of material surfaces --
Fractal-based methods for the description of surfaces --
Slit island analysis --
Profile analysis --
3D surface analysis --
Surface area method --
FBM method --
Dynamic scaling method --
Variation-correlation method for the description of 3D surfaces --
Algorithm of the variation method --
Algorithm of the variation-correlation method. 3D fractal model: the variation-correlation function and its properties --
Fractal measure and estimation of fractal characteristic length --
Physical meaning of fractal characteristic length --
Physical meaning of fractal dimension --
Saturated value of height variation of a surface --
Irregularity of Graphite Nodules --
Measurement procedures --
Quantitative analysis --
Quantitative analysis of irregularity of graphite boundary --
Quantitative analysis of the irregularity of the aggregated state of graphite nodules in 2D metallographic sections --
Quantitative analysis of the irregularity of 3D surfaces of graphite nodules --
A statistical method to analyze a group of graphite nodules --
Fractal Growth of Graphite Nodules --
Growth of graphite nodules --
Fractal growth of graphite nodules --
Experimental observations and fractal measurements --
Fractal characteristics --
Fractal growth models of graphite nodules --
Fractal-based model for diffusion-controlled growth --
Fractal-based model for dissolution --
controlled growth --
Interpretation of fractal growth of graphite nodules --
Thermodynamic growth of graphite nodules --
Kinetic growth of graphite nodules --
Fractal-based Study of Magnetic Thin Films --
Magnetic thin films --
Preparation of magnetic thin films --
Description of the surfaces of magnetic thin films --
Theoretical analysis of the relationship between fractal dimension and surface energy of thin films --
VCF-based quantitative analysis on the surfaces of magnetic thin films. Description of the magnetic microstructures of magnetic thin films --
Irregular geometrical features of MFM magnetic microstructures --
Relationship between fractal parameters and coercivity --
Relationship between D[subscript cor] and ([delta]M)[subscript max] --
Fractal-based Study of Fracture Surfaces --
Fractography --
Fracture and fractals --
Physical meaning of the secondary electron image --
Influence of SEM parameters on D[subscript cor] --
Brightness number --
Contrast number --
Working distance --
Local current --
Accelerating voltage --
Tilt angle --
Spot size number --
Influence of noise on D[subscript cor] --
Fractal characteristics and mechanical properties --
Fractal characteristics with different fracture modes --
Relationship between fractal dimension and mechanical properties --
Brittle fracture --
Ductile fracture --
Quantitative fractography --
VCF-Based edge detection on fracture surfaces --
Segmentation of fracture surfaces.
Responsibility: by J.M. Li ... [et al.].
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Primary Entity

<http://www.worldcat.org/oclc/52251454> # Image-based fractal description of microstructures
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "52251454" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/mau> ;
   library:placeOfPublication <http://dbpedia.org/resource/Boston> ; # Boston
   schema:about <http://dewey.info/class/620.11299/e21/> ;
   schema:about <http://id.worldcat.org/fast/1020118> ; # Microstructure
   schema:about <http://experiment.worldcat.org/entity/work/data/437213092#Topic/mikrostruktur> ; # Mikrostruktur
   schema:about <http://experiment.worldcat.org/entity/work/data/437213092#Topic/fraktal> ; # Fraktal
   schema:about <http://id.worldcat.org/fast/933507> ; # Fractals
   schema:about <http://id.worldcat.org/fast/967501> ; # Image processing
   schema:about <http://experiment.worldcat.org/entity/work/data/437213092#Topic/werkstoff> ; # Werkstoff
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://experiment.worldcat.org/entity/work/data/437213092#Person/li_j_m> ; # J. M. Li
   schema:datePublished "2003" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/437213092> ;
   schema:inLanguage "en" ;
   schema:name "Image-based fractal description of microstructures"@en ;
   schema:numberOfPages "272" ;
   schema:productID "52251454" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/52251454#PublicationEvent/boston_kluwer_academic_publishers_2003> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/437213092#Agent/kluwer_academic_publishers> ; # Kluwer Academic Publishers
   schema:url <http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=010351902&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA> ;
   schema:url <http://catdir.loc.gov/catdir/enhancements/fy0821/2003047573-t.html> ;
   schema:workExample <http://worldcat.org/isbn/9781402075070> ;
   umbel:isLike <http://bnb.data.bl.uk/id/resource/GBA353509> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/52251454> ;
    .


Related Entities

<http://dbpedia.org/resource/Boston> # Boston
    a schema:Place ;
   schema:name "Boston" ;
    .

<http://experiment.worldcat.org/entity/work/data/437213092#Agent/kluwer_academic_publishers> # Kluwer Academic Publishers
    a bgn:Agent ;
   schema:name "Kluwer Academic Publishers" ;
    .

<http://id.worldcat.org/fast/1020118> # Microstructure
    a schema:Intangible ;
   schema:name "Microstructure"@en ;
    .

<http://id.worldcat.org/fast/933507> # Fractals
    a schema:Intangible ;
   schema:name "Fractals"@en ;
    .

<http://id.worldcat.org/fast/967501> # Image processing
    a schema:Intangible ;
   schema:name "Image processing"@en ;
    .

<http://worldcat.org/isbn/9781402075070>
    a schema:ProductModel ;
   schema:isbn "1402075073" ;
   schema:isbn "9781402075070" ;
    .


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