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Image matching and analysis : 22-24 October 2001, Wuhan, China

Author: Bir BhanuJ ShenT ZhangSociety of Photo-optical Instrumentation Engineers.Hua zhong gong xue yuan.All authors
Publisher: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©2001.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 4552.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
International Symposium on Multispectral Image Processing and Pattern Recognition (2nd : 2001 : Wuhan, China).
Image matching and analysis.
Bellingham, Wash., USA : SPIE, ©2001
(OCoLC)604821228
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Bir Bhanu; J Shen; T Zhang; Society of Photo-optical Instrumentation Engineers.; Hua zhong gong xue yuan.; Université de Bordeaux III.; Guo jia zi ran ke xue ji jin wei yuan hui (China); China. Jiao yu bu.
ISBN: 0819442801 9780819442802
OCLC Number: 49255037
Notes: "Second SPIE International Symposium on Multispectral Image Processing and Pattern Recognition"--Page xi.
Addendum tipped in.
Description: xi, 342 pages : illustrations ; 28 cm.
Contents: Image processing --
Image matching --
Image analysis --
Image analysis and filtering --
Poster session.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 4552.
Other Titles: Multispectral image processing and pattern recognition.
Responsibility: Bir Bhanu, Jun Shen, Tianxu Zhang, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) [and others] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China.

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