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Image matching and analysis : 22-24 October 2001, Wuhan, China

Author: Bir BhanuJ ShenT ZhangSociety of Photo-optical Instrumentation Engineers.Hua zhong gong xue yuan.All authors
Publisher: Bellingham, Wash., USA : SPIE, ©2001.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 4552.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (DLC) 2002277664
(OCoLC)50323162
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Bir Bhanu; J Shen; T Zhang; Society of Photo-optical Instrumentation Engineers.; Hua zhong gong xue yuan.; Université de Bordeaux III.; Guo jia zi ran ke xue ji jin wei yuan hui (China); China. Jiao yu bu.; SPIE Digital Library.
ISBN: 0819442801 9780819442802
OCLC Number: 53836791
Notes: "Second SPIE International Symposium on Multispectral Image Processing and Pattern Recognition"--Page xi.
Addendum tipped in.
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: xi, 342 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 4552.
Responsibility: Bir Bhanu, Jun Shen, Tianxu Zhang, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) [and others] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China.

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