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Image processing and pattern recognition in remote sensing : 25-27 October 2002, Hangzhou, China

Author: S G UngarShiyi MaoYoshifumi YasuokaZhongguo hai yang xue hui.Society of Photo-optical Instrumentation Engineers.All authors
Publisher: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©2003.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 4898.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Congrès
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: S G Ungar; Shiyi Mao; Yoshifumi Yasuoka; Zhongguo hai yang xue hui.; Society of Photo-optical Instrumentation Engineers.; United States. National Aeronautics and Space Administration. Earth Science Technology Office.; Guo jia yao gan zhong xin (China)
ISBN: 081944684X 9780819446848
OCLC Number: 52577024
Description: xi, 328 pages : illustrations ; 28 cm.
Contents: Session 1. Combined model- and image-based procedure for calibrating multitemporal sequences of TM and ETM+ imagery to absolute reflectance values --
Session 2. A new theory and method for non-model ore-deposit prediction: phase-separation analysis of remote sensing information field of metallogenetic environment --
Session 3. Improving the analysis of Hyperion red-edge index from an agricultural area (invited paper) --
Session 4. Bird habitat mapping in the Kakadu National Park, Australia, using synthetic aperture radar (NASA/JPL AIRSAR) (invited paper) --
Poster session Clustering of high-resolution remote sensing imagery.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 4898.
Responsibility: Stephen G. Ungar, Shiyi Mao, Yoshifumi Yasuoka, chairs/editors ; sponsored by CSO--Chinese Society of Oceanography (China) [and] SPIE--The International Society for Optical Engineering ; cosponsors and supporting organizations, NASA Earth Science Technology Office (USA) [and others] ; cooperating organizations, National Remote Sensing Center of China (China) [and others].

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