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Image processing and pattern recognition in remote sensing : 25-27 October 2002, Hangzhou, China

Author: Stephen G UngarShiyi MaoYoshifumi YasuokaZhongguo hai yang xue hui.Society of Photo-optical Instrumentation Engineers.All authors
Publisher: Bellingham, Wash., USA : SPIE, ©2003.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 4898.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: (OCoLC)52577024
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Stephen G Ungar; Shiyi Mao; Yoshifumi Yasuoka; Zhongguo hai yang xue hui.; Society of Photo-optical Instrumentation Engineers.; United States. National Aeronautics and Space Administration. Earth Science Technology Office.; Guo jia yao gan zhong xin (China); SPIE Digital Library.
ISBN: 081944684X 9780819446848
OCLC Number: 53838026
Reproduction Notes: Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Description: xi, 328 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 4898.
Responsibility: Stephen G. Ungar, Shiyi Mao, Yoshifumi Yasuoka, chairs/editors ; sponsored by CSO--Chinese Society of Oceanography (China) [and] SPIE--The International Society for Optical Engineering ; cosponsors and supporting organizations, NASA Earth Science Technology Office (USA) [and others] ; cooperating organizations, National Remote Sensing Center of China (China) [and others].

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