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Image quality and system performance : 19-20 January, 2004, San Jose, California, USA

Author: Yoichi Miyake; D René Rasmussen; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash., USA : SPIE, ©2004.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5294.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Yoichi Miyake; D René Rasmussen; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
ISBN: 0819451975 9780819451972
OCLC Number: 54408903
Description: viii, 256 pages : illustrations (some color) ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5294.
Other Titles: Electronic imaging science and technology
Responsibility: Yoichi Miyake, D. René Rasmussen ; sponsored ... by IS & T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.

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