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Image quality and system performance III : 17-19 January, 2006, San Jose, California, USA

Author: Luke C Cui; Yoichi Miyake; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash. : SPIE ; Springfield, Va. : IS & T, ©2006.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 6059.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Luke C Cui; Yoichi Miyake; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
ISBN: 0819460990 9780819460998
OCLC Number: 65188397
Description: 1 volume (various pagings) : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 6059.
Other Titles: Electronic imaging science and technology
Responsibility: Luke C. Cui, Yoichi Miyake, chairs/editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.

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Primary Entity

<http://www.worldcat.org/oclc/65188397> # Image quality and system performance III : 17-19 January, 2006, San Jose, California, USA
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "65188397" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/866023632#Place/bellingham_wash> ; # Bellingham, Wash.
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/866023632#Place/springfield_va> ; # Springfield, Va.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/wau> ;
   schema:about <http://id.worldcat.org/fast/967501> ; # Image processing
   schema:about <http://experiment.worldcat.org/entity/work/data/866023632#Topic/imaging_systems_image_quality> ; # Imaging systems--Image quality
   schema:about <http://id.worldcat.org/fast/967536> ; # Image transmission
   schema:about <http://experiment.worldcat.org/entity/work/data/866023632#Topic/image_processing> ; # Image processing
   schema:about <http://experiment.worldcat.org/entity/work/data/866023632#Topic/image_transmission> ; # Image transmission
   schema:about <http://dewey.info/class/621.367/e22/> ;
   schema:about <http://id.worldcat.org/fast/967612> ; # Imaging systems--Image quality
   schema:alternateName "Electronic imaging science and technology" ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/127619765> ; # Society of Photo-optical Instrumentation Engineers.
   schema:contributor <http://viaf.org/viaf/266183142> ; # IS & T--the Society for Imaging Science and Technology.
   schema:contributor <http://viaf.org/viaf/24372231> ; # Luke C. Cui
   schema:contributor <http://experiment.worldcat.org/entity/work/data/866023632#Person/miyake_yoichi> ; # Yoichi Miyake
   schema:copyrightYear "2006" ;
   schema:datePublished "2006" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/866023632> ;
   schema:genre "Conference publication"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/866023632#Series/proceedings_of_electronic_imaging_science_and_technology> ; # Proceedings of Electronic Imaging Science and Technology.
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/866023632#Series/spie> ; # SPIE ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/866023632#Series/proceedings_of_spie_the_international_society_for_optical_engineering> ; # Proceedings of SPIE--the International Society for Optical Engineering ;
   schema:name "Image quality and system performance III : 17-19 January, 2006, San Jose, California, USA"@en ;
   schema:productID "65188397" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/65188397#PublicationEvent/bellingham_wash_spie_springfield_va_is_&_t_2006> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/866023632#Agent/spie> ; # SPIE
   schema:publisher <http://experiment.worldcat.org/entity/work/data/866023632#Agent/is_&_t> ; # IS & T
   schema:workExample <http://worldcat.org/isbn/9780819460998> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/65188397> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/866023632#Meeting/electronic_imaging_science_and_technology_symposium> # Electronic Imaging Science and Technology Symposium.
    a bgn:Meeting, schema:Event ;
   schema:name "Electronic Imaging Science and Technology Symposium." ;
    .

<http://experiment.worldcat.org/entity/work/data/866023632#Person/miyake_yoichi> # Yoichi Miyake
    a schema:Person ;
   schema:familyName "Miyake" ;
   schema:givenName "Yoichi" ;
   schema:name "Yoichi Miyake" ;
    .

<http://experiment.worldcat.org/entity/work/data/866023632#Place/bellingham_wash> # Bellingham, Wash.
    a schema:Place ;
   schema:name "Bellingham, Wash." ;
    .

<http://experiment.worldcat.org/entity/work/data/866023632#Place/springfield_va> # Springfield, Va.
    a schema:Place ;
   schema:name "Springfield, Va." ;
    .

<http://experiment.worldcat.org/entity/work/data/866023632#Series/proceedings_of_electronic_imaging_science_and_technology> # Proceedings of Electronic Imaging Science and Technology.
    a bgn:PublicationSeries ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/866023632#Meeting/electronic_imaging_science_and_technology_symposium> ; # Electronic Imaging Science and Technology Symposium.
   schema:hasPart <http://www.worldcat.org/oclc/65188397> ; # Image quality and system performance III : 17-19 January, 2006, San Jose, California, USA
   schema:name "Proceedings of Electronic Imaging Science and Technology." ;
   schema:name "Proceedings of electronic imaging science and technology" ;
    .

<http://experiment.worldcat.org/entity/work/data/866023632#Series/proceedings_of_spie_the_international_society_for_optical_engineering> # Proceedings of SPIE--the International Society for Optical Engineering ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/65188397> ; # Image quality and system performance III : 17-19 January, 2006, San Jose, California, USA
   schema:name "Proceedings of SPIE--the International Society for Optical Engineering ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/866023632#Series/spie> # SPIE ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/65188397> ; # Image quality and system performance III : 17-19 January, 2006, San Jose, California, USA
   schema:name "SPIE ;" ;
    .

<http://id.worldcat.org/fast/967501> # Image processing
    a schema:Intangible ;
   schema:name "Image processing"@en ;
    .

<http://id.worldcat.org/fast/967536> # Image transmission
    a schema:Intangible ;
   schema:name "Image transmission"@en ;
    .

<http://id.worldcat.org/fast/967612> # Imaging systems--Image quality
    a schema:Intangible ;
   schema:name "Imaging systems--Image quality"@en ;
    .

<http://viaf.org/viaf/127619765> # Society of Photo-optical Instrumentation Engineers.
    a schema:Organization ;
   schema:name "Society of Photo-optical Instrumentation Engineers." ;
    .

<http://viaf.org/viaf/24372231> # Luke C. Cui
    a schema:Person ;
   schema:familyName "Cui" ;
   schema:givenName "Luke C." ;
   schema:name "Luke C. Cui" ;
    .

<http://viaf.org/viaf/266183142> # IS & T--the Society for Imaging Science and Technology.
    a schema:Organization ;
   schema:name "IS & T--the Society for Imaging Science and Technology." ;
    .

<http://worldcat.org/isbn/9780819460998>
    a schema:ProductModel ;
   schema:isbn "0819460990" ;
   schema:isbn "9780819460998" ;
    .

<http://www.worldcat.org/title/-/oclc/65188397>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/65188397> ; # Image quality and system performance III : 17-19 January, 2006, San Jose, California, USA
   schema:dateModified "2016-05-11" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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