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The impact of internal sampling circuitry on the phase error of the nose-to-nose oscilloscope calibration

Author: Kate A Remley; National Institute of Standards and Technology (U.S.)
Publisher: Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2003]
Series: NIST technical note, 1528.
Edition/Format:   eBook : Document : National government publication : English
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Material Type: Document, Government publication, National government publication, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Kate A Remley; National Institute of Standards and Technology (U.S.)
OCLC Number: 755076356
Notes: Title from title screen (viewed on Sept. 30, 2011).
"August 2003."
Description: 1 online resource (iv, 64 pages) : color illustrations.
Series Title: NIST technical note, 1528.
Responsibility: Kate A. Remley.

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