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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/78212663 Title: Inside the new TOEIC exam Author: Donald Van Metre; Kaplan Test Prep and Admissions Publisher: New York : Kaplan, 2007. ISBN/ISSN: 1419591509 : 9781419591501 OCLC:78212663

  
  

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Subjects

• Test of English for International Communication -- Study guides.
• English language -- Textbooks for foreign speakers.
• English language -- Examinations -- Study guides.

Similar Items

Inside the new TOEIC exam

Author:	Donald Van Metre; Kaplan Test Prep and Admissions.
Publisher:	New York : Kaplan, 2007.
Edition/Format:	Book : English
Rating:	(not yet rated) 0 with reviews - Be the first.