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INSTANT--IGBT network simulation and transient ANalysis tool

Author: A R Hefner; National Institute of Standards and Technology (U.S.)
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1992.
Series: NIST special publication, 400-88.; Semiconductor measurement technology.
Edition/Format:   Print book : National government publication : EnglishView all editions and formats
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Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: A R Hefner; National Institute of Standards and Technology (U.S.)
OCLC Number: 26556683
Notes: "June 1992."
Description: vii, 151 pages : illustrations ; 28 cm.
Series Title: NIST special publication, 400-88.; Semiconductor measurement technology.
Responsibility: A.R. Hefner, Jr.

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