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An integrated approach to system design, reliability, and diagnosis

Author: Frances Ann Patterson-Hine; David L Iverson; Ames Research Center.
Publisher: Moffett Field, Calif. : National Aeronautics and Space Administration, Ames Research Center ; [Springfield, Va.] : [National Technical Information Service, distributor], [1990]
Series: NASA technical memorandum, 102861.
Edition/Format:   Book   Microform : National government publication : Microfiche : English
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Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: Frances Ann Patterson-Hine; David L Iverson; Ames Research Center.
OCLC Number: 32363497
Notes: Distributed to depository libraries in microfiche.
Reproduction Notes: Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1990]. 1 microfiche.
Description: 1 volume.
Series Title: NASA technical memorandum, 102861.
Responsibility: F.A. Patterson-Hine and David L. Iverson.

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